共 41 条
[1]
[Anonymous], 2007, INT TECHNOLOGY ROADM
[2]
BAUSUM T, 2003, SEMICONDUCTOR I 0106
[3]
Stripping of photoresist using a remote thermal Ar/O2 and Ar/N2/O2 plasma
[J].
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B,
2003, 21 (01)
:61-66
[4]
Dopant loss of ultrashallow junction by wet chemical cleaning
[J].
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B,
2006, 24 (01)
:499-502
[5]
Plasma induced substrate damage in high dose implant resist strip process
[J].
2003 8TH INTERNATIONAL SYMPOSIUM ON PLASMA- AND PROCESS-INDUCED DAMAGE,
2003,
:73-76
[8]
FLEMING D, 1977, FUTURE FAB INT, V4, P177