Extraction of Process-Structure Evolution Linkages from X-ray Scattering Measurements Using Dimensionality Reduction and Time Series Analysis

被引：27

作者：

Brough, David B. ^{[1
]}

Kannan, Abhiram ^{[2
]}

Haaland, Benjamin ^{[3
]}

Bucknall, David G. ^{[2
]}

Kalidindi, Surya R. ^{[1
,2
,4
]}

机构：

[1] Georgia Inst Technol, Sch Computat Sci & Engn, North Ave NW, Atlanta, GA 30332 USA

[2] Georgia Inst Technol, Sch Mat Sci & Engn, North Ave NW, Atlanta, GA 30332 USA

[3] Georgia Inst Technol, H Milton Stewart Sch Ind & Syst Engn, North Ave NW, Atlanta, GA 30332 USA

[4] Georgia Inst Technol, George W Woodruff Sch Mech Engn, North Ave NW, Atlanta, GA 30332 USA

来源：

INTEGRATING MATERIALS AND MANUFACTURING INNOVATION | 2017年 / 6卷 / 02期

基金：

美国国家科学基金会;

关键词：

Materials knowledge systems; Hierarchical materials; Multiscale materials; PyMKS; SAXS; Polyethylene; Process-structure linkage; Microstructure evolution; Time series; DATA SCIENCE; ELASTIC RESPONSE; MICROSTRUCTURE; POLYETHYLENE; REGRESSION; MODEL; ALGORITHMS; FRAMEWORK; VARIABLES; COMPLEX;

D O I：

10.1007/s40192-017-0093-4

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The rapid development of robust, reliable, and reduced-order process-structure evolution linkages that take into account hierarchical structure are essential to expedite the development and manufacturing of new materials. Towards this end, this paper lays a theoretical framework that injects the established time series analysis into the recently developed materials knowledge systems (MKS) framework. This new framework is first presented and then demonstrated on an ensemble dataset obtained using small-angle X-ray scattering on semi-crystalline linear low density polyethylene films from a synchrotron X-ray scattering experiment.

引用

页码：147 / 159

页数：13

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