Characterization of polyaniline thin films prepared by cluster beam deposition methods

被引：6

作者：

Lim, H

Kim, BJ

Choi, JH

机构：

[1] Korea Univ, Dept Chem, Seoul 136701, South Korea

[2] Korea Univ, Ctr Electro & Photorespons Mol, Seoul 136701, South Korea

来源：

SYNTHETIC METALS | 2003年 / 135卷 / 1-3期

关键词：

polyaniline thin film; cluster beam deposition; UV-visible absorption spectroscopy; X-ray photoelectron spectroscopy; atomic force microscopy;

D O I：

10.1016/S0379-6779(02)00568-4

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Polyaniline (PANI) films have been prepared by applying neutral and ionized cluster beam deposition (NCBD and ICBD) methods. Spectroscopic studies demonstrate that the dominant chemical structure of the as-deposited PANI films corresponds to the reduced leucoemeraldine state in comparison to the initial emeraldine state. Atomic force microscopy (AFM) measurements show that the cluster beam deposition method is effective in producing uniform polymeric films consisting of the reduced PANI species.

引用

页码：81 / 82

页数：2

共 4 条

[1] Poly[2-(N-carbazolyl)-5-(2-ethylhexyloxy)-1,4-phenylenevinylene]/tris(8-hydroxyquinoline) aluminum heterojunction electroluminescent devices produced by cluster beam deposition methods [J].