Microstructure evolution and interface migration

被引：1

作者：

Brechet, YJM

机构：

[1] Inst Natl Polytech Grenoble, F-38402 St Martin Dheres, France

[2] Inst Univ France, LTPCM, F-38402 St Martin Dheres, France

来源：

SOLID STATE PHENOMENA | 1997年 / 56卷

关键词：

interfaces; grain boundaries; multilayers; microstructure; diffusion;

D O I：

10.4028/www.scientific.net/SSP.56.51

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Microstructure evolution in metallimaterials is often related to the thermodynamics and kinetic properties of internal interfaces such as Grain Boundaries and Interphases. These objects have an increasing importance in multilayers. The present paper will focus on some of the issues concerning microstructural instabilities and involving interfaces, either in natural materials or in artificial structures.

引用

页码：51 / 66

页数：16

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