Effect of Vacuum Annealing on Tensile Mechanical Characteristics of Au Bonding Wires

被引:0
|
作者
Takagi, Akio [1 ]
Kato, Takaaki [2 ]
Miyake, Shugo [2 ]
Inoue, Shozo [1 ]
Namazu, Takahiro [1 ]
机构
[1] Univ Hyogo, Dept Mech Engn, 2167 Shosha, Himeji, Hyogo 6712201, Japan
[2] Kobelco Res Inst Inc, Nishi Ku, 1-5-5 Takatsukadai, Kobe, Hyogo 6512271, Japan
关键词
Au bonding wire; tensile test; Young's modulus; yield strength; annealing; grain growth; UNIAXIAL TENSILE; FILMS; MICROSTRUCTURE; DEFORMATION; STRENGTH; BEHAVIOR; SILICON;
D O I
暂无
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
In this paper, the effect of vacuum annealing on the mechanical properties of Au bonding wires is described. Au bonding wires with a diameter of 25 mu m are subjected to quasi-static uniaxial tensile tests in laboratory air. The bonding wire specimens are prepared by attaching a wire to a Si frame fabricated by deep reactive ion etching (DRIE). The mean Young's modulus and 0.2% offset yield strength are 114 GPa and 354 MPa, respectively. By annealing at 100-300 degrees C for 10 min in vacuum, Young's modulus gradually decreases with increasing annealing temperature, whereas yield strength rapidly decreases in the annealed wires at temperatures above 200 degrees C. The annealing effect is discussed on the basis of the change in the number of recrystallized grains in the wires.
引用
收藏
页码:163 / 171
页数:9
相关论文
共 50 条
  • [1] Effect of vacuum annealing on tensile mechanical characteristics of Au bonding wires
    Takagi A.
    Kato T.
    Miyake S.
    Inoue S.
    Namazu T.
    Namazu, Takahiro (namazu@eng.u-hyogo.ac.jp), 1600, M Y U Scientific Publishing Division (28): : 163 - 171
  • [2] ANNEALING EFFECT AND TENSILE INTERFACE FRACTURE MECHANISM OF PURE SILVER BONDING WIRES
    Hsueh, Hao-Wen
    Hung, Fei-Yi
    Lui, Truan-Sheng
    Chen, Li-Hui
    EPD CONGRESS 2012, 2012, : 145 - 152
  • [3] Effect of Annealing Twins on Electromigration in Ag-8Au-3Pd Bonding Wires
    Tung-Han Chuang
    Hsi-Ching Wang
    Chien-Hsun Chuang
    Jun-Der Lee
    Hsing-Hua Tsai
    Journal of Electronic Materials, 2013, 42 : 545 - 551
  • [4] Effect of Annealing Twins on Electromigration in Ag-8Au-3Pd Bonding Wires
    Chuang, Tung-Han
    Wang, Hsi-Ching
    Chuang, Chien-Hsun
    Lee, Jun-Der
    Tsai, Hsing-Hua
    JOURNAL OF ELECTRONIC MATERIALS, 2013, 42 (03) : 545 - 551
  • [5] Effects of Annealing Twins on the Grain Growth and Mechanical Properties of Ag-8Au-3Pd Bonding Wires
    Tung-Han Chuang
    Chih-Hsin Tsai
    Hsi-Ching Wang
    Che-Cheng Chang
    Chien-Hsun Chuang
    Jun-Der Lee
    Hsing-Hua Tsai
    Journal of Electronic Materials, 2012, 41 : 3215 - 3222
  • [6] Effects of Annealing Twins on the Grain Growth and Mechanical Properties of Ag-8Au-3Pd Bonding Wires
    Chuang, Tung-Han
    Tsai, Chih-Hsin
    Wang, Hsi-Ching
    Chang, Che-Cheng
    Chuang, Chien-Hsun
    Lee, Jun-Der
    Tsai, Hsing-Hua
    JOURNAL OF ELECTRONIC MATERIALS, 2012, 41 (11) : 3215 - 3222
  • [7] Surface activated bonding of Ti/Au and Ti/Pt/Au films after vacuum annealing for MEMS packaging
    Matsumae, Takashi
    Kurashima, Yuichi
    Takagi, Hideki
    MICROELECTRONIC ENGINEERING, 2018, 197 : 76 - 82
  • [8] Microstructure, electric flame-off characteristics and tensile properties of silver bonding wires
    Hsueh, Hao-Wen
    Hung, Fei-Yi
    Lui, Truan-Sheng
    Chen, Li-Hui
    MICROELECTRONICS RELIABILITY, 2011, 51 (12) : 2243 - 2249
  • [9] Purifying carbon nanotube wires by vacuum annealing
    Sundaram, Rajyashree
    Yamada, Takeo
    Hata, Kenji
    Sekiguchi, Atsuko
    MATERIALS TODAY-PROCEEDINGS, 2018, 5 (13) : 27316 - 27326
  • [10] Effect of annealing and polishing on flashover characteristics of ceramic in vacuum
    Shioiri, T
    Shindo, T
    Kamikawaji, T
    Kaneko, E
    Ohshima, I
    IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION, 2002, 9 (03) : 416 - 420