A New Test Procedure to Measure Power Electronic Devices' Frequency Coupling Admittance

被引：31

作者：

Gallo, Daniele ^{[1
]}

Langella, Roberto ^{[1
]}

Luiso, Mario ^{[1
]}

Testa, Alfredo ^{[1
]}

Watson, Neville R. ^{[2
]}

机构：

[1] Univ Campania Luigi Vanvitelli, Dept Engn, I-81100 Aversa, Italy

[2] Univ Canterbury, Dept Elect & Comp Engn, Christchurch 8041, New Zealand

来源：

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT | 2018年 / 67卷 / 10期

关键词：

Admittance; frequency coupling matrix; harmonics; phase-dependent characteristics; power electronics; power quality; power system measurement; MATRIX; CONVERTERS;

D O I：

10.1109/TIM.2018.2819318

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

One method to model power electronic devices for harmonic emission studies is using frequency-domain models based on the frequency coupling matrices. This paper presents a new test procedure for the experimental evaluation of the frequency coupling matrix elements of power electronic devices. An automated test system is designed, realized, and characterized from a metrological perspective. Experimental tests show the tremendous increase in speed of the new test procedure in comparison to the classical test procedures present in the literature, with the same levels of accuracy of obtained results.

引用

页码：2401 / 2409

页数：9

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