High-precision measurement of temperature factors for NiAl by convergent-beam electron diffraction

被引：23

作者：

Nuchter, W ^{[1
]}

Weickenmeier, AL ^{[1
]}

Mayer, J ^{[1
]}

机构：

[1] Max Planck Inst Met Forsch, D-70174 Stuttgart, Germany

来源：

ACTA CRYSTALLOGRAPHICA SECTION A | 1998年 / 54卷

关键词：

D O I：

10.1107/S0108767397010969

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

Convergent-beam electron diffraction is applied to measure the temperature factors of the intermetallic phase NiAl with high accuracy. The patterns are recorded in an energy-filtering transmission electron microscope at zero energy loss using a slow-scan CCD camera. The specimens were tilted in systematic row orientation. In this new approach, data are extracted from the bright-field disc as well as from several high-order dark-field discs along line scans. The temperature factors are determined by fitting Bloch-wave simulations to the intensity profiles. The harmonic approximation for temperature factors is used. For B2-phase NiAl, mean thermal displacements u(Ni) = 5.5 +/- 0.1 and u(Al) = 5.7 +/- 0.1 pm are obtained at 100 K. A very detailed error analysis is given, and stochastic and systematic errors are discussed and quantified.

引用

页码：147 / 157

页数：11

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