Excimer laser crystallization of amorphous silicon on metal coated glass substrates

被引:14
作者
Brendel, K
Nickel, NH
Lengsfeld, P
Schöpke, A
Sieber, I
Nerding, M
Strunk, HP
Fuhs, W
机构
[1] Hahn Meitner Inst Berlin GmbH, D-12489 Berlin, Germany
[2] Univ Erlangen Nurnberg, Inst Werkstoffwissensch Mikrocharakterisierung, D-91058 Erlangen, Germany
关键词
laser crystallization; metal induced crystallization; polycrystalline silicon;
D O I
10.1016/S0040-6090(02)01251-8
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The influence of metal coatings of glass substrates on the laser crystallization process of amorphous silicon is investigated. Three different metals were chosen: Mo, Al and Ni. Amorphous silicon was deposited on top of the metal and crystallized using a XeCl excimer laser. Auger electron spectroscopy and Raman measurements show that in case of Ni and Al an intermixing with the polycrystalline silicon (poly-Si) due to the laser treatment occurs resulting in a rough film. In the case of Al, regions of highly Al doped poly-Si were observed. On the other hand laser crystallization of a-Si:H on Mo coated glass does not result in an intermixing. The average grain size varies with the laser fluence. In the super lateral growth regime grains of size up to 1 mum can be fabricated. These large grains show a preferential surface orientation along the {1 1 1} direction. (C) 2002 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:86 / 90
页数:5
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