Size dependence of the bulk modulus of Si nanocrystals

被引：35

作者：

Abdullah, B. J. ^{[1
]}

Omar, M. S. ^{[1
]}

Jiang, Q. ^{[2
]}

机构：

[1] Salahaddin Erbil Univ, Dept Phys, Coll Sci, Erbil 31019, Kurdistan Regio, Iraq

[2] Jilin Univ, Dept Mat Sci & Engn, Changchun 130022, Jilin, Peoples R China

来源：

SADHANA-ACADEMY PROCEEDINGS IN ENGINEERING SCIENCES | 2018年 / 43卷 / 11期

关键词：

Si; nanocrystals; bulk modulus; mass density; melting temperature; LATTICE THERMAL-EXPANSION; MELTING TEMPERATURES; THIN-FILMS; DENSITY; NANOPARTICLES; THICKNESS;

D O I：

10.1007/s12046-018-0956-1

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

This study investigates the effect of size on bulk modulus and its related parameters, including melting temperature and mass density based on the ratio number of surface atoms to that of its internal. The equation of bulk modulus in the bulk state B() is modified to include the related size-dependent parameters without any adjustable parameter, and is applied to Si nanocrystals. The bulk modulus B(r) decreases from 9.8x10(10)Nm(2) for the bulk state to 5.93x10(10)Nm(2) for a 5nm diameter of Si nanoparticles. An inherent relation between bulk modulus and change of the lattice parameter in nanocrystals obtained from the variation in the surface to volume ratio, this leads to increase in the mean bond length. The effect of mass density and melting temperature on bulk modulus are also discussed. Calculated results for bulk modulus are verified by experimental as well as the available computer simulation data.

引用

页数：5

共 37 条

[1]

Abdullah BJ, 2017, P NATL ACAD SCI IN A, P1

[2] Effects of size on mass density and its influence on mechanical and thermal properties of ZrO2 nanoparticles in different structures [J].

Abdullah, Botan Jawdat ;

Jiang, Qing ;

Omar, Mustafa Saeed .

BULLETIN OF MATERIALS SCIENCE, 2016, 39 (05) :1295-1302

[3] Specific heat of nanocrystals [J].

Avramov, I. ;

Michailov, M. .

JOURNAL OF PHYSICS-CONDENSED MATTER, 2008, 20 (29)

[4] Lattice expansion in nanocrystalline niobium thin films [J].

Banerjee, R ;

Sperling, EA ;

Thompson, GB ;

Fraser, HL ;

Bose, S ;

Ayyub, P .

APPLIED PHYSICS LETTERS, 2003, 82 (24) :4250-4252

[5] Polymorphic bcc to fcc transformation of nanocrystalline niobium studied by positron annihilation [J].

Chattopadhyay, PP ;

Nambissan, PMG ;

Pabi, SK ;

Manna, I .

PHYSICAL REVIEW B, 2001, 63 (05)

[6] Size dependence of the bulk modulus of semiconductor nanocrystals from first-principles calculations [J].

Cherian, R. ;

Gerard, C. ;

Mahadevan, P. ;

Nguyen Thanh Cuong ;

Maezono, Ryo .

PHYSICAL REVIEW B, 2010, 82 (23)

[7] A MORE ACCURATE VALUE FOR THE AVOGADRO CONSTANT [J].

DEBIEVRE, P ;

VALKIERS, S ;

PEISER, S ;

BECKER, P ;

LUDICKE, F ;

SPIEWECK, F ;

STUMPEL, J .

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1995, 44 (02) :530-532

[8] Quantification the effect of the thickness of thin films on their elastic parameters [J].

Gacem, A. ;

Doghmane, A. ;

Hadjoub, Z. .

ADVANCES IN INNOVATIVE MATERIALS AND APPLICATIONS, 2011, 324 :93-+

[9] Nanostructured materials: Basic concepts and microstructure [J].

Gleiter, H .

ACTA MATERIALIA, 2000, 48 (01) :1-29

[10] The melting of silicon nanocrystals: Submicron thin-film structures derived from nanocrystal precursors [J].

Goldstein, AN .

APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1996, 62 (01) :33-37

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