Fault diagnosis of analog circuits by operation-region model and X-Y Zoning method

被引：5
作者：
Miura, Y [1 ]
机构：
[1] Tokyo Metropolitan Univ, Grad Sch Engn, Tokyo 158, Japan
来源：
19TH IEEE INTERNATIONAL SYMPOSIUM ON DEFECT AND FAULT TOLERANCE IN VLSI SYSTEMS, PROCEEDINGS | 2004年
关键词：
D O I：
10.1109/DFTVS.2004.1347844
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
An X-Y zoning method can detect faults of analog circuits by using the relationship between circuit inputs and outputs. An operation-region model can analyze/model circuit behaviors by observing changes in the operation regions of MOS transistors in a circuit. In this paper, we propose a method for diagnosing analog circuits by combining the OR model and the X-Y zoning method A diagnosis procedure is realized by the similar way to the method for digital circuits. In order to demonstrate the effectiveness of the proposed method, we apply the method to ITC'97 benchmark circuits with hard faults and soft faults. We obtained the result that the diagnostic resolution is one for every fault.
引用
收藏
页码：230 / 238
页数：9
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