A simple testing technique for embedded systems

被引:0
作者
Fouchal, H [1 ]
Rollet, A [1 ]
机构
[1] Univ Reims, LICA, F-51687 Reims 2, France
来源
PRINCIPLES OF DISTRIBUTED SYSTEMS | 2004年 / 3144卷
关键词
D O I
暂无
中图分类号
TP301 [理论、方法];
学科分类号
081202 ;
摘要
Embedded systems are constrained and critical. They need to be validated before their development. They handle time constraints to model important aspects (delays, timeouts). This issue has to be taken into account in every step during its development life cycle, in particular in the testing step. This paper presents a methodology for the development of reliable embedded systems. A system is described as a timed automaton. It details an efficient derivation algorithm of test sequences able to identify controllable states on the system. Most of known errors of such systems are collected. They are automatically integrated on the derived sequences which are submitted to the implementation. If the system behaves correctly after this submission, the system is considered as robust.
引用
收藏
页码:159 / 170
页数:12
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