Residual stresses in thermal barrier coatings measured by photoluminescence piezospectroscopy and indentation technique

被引：55

作者：

Zhao, X. ^{[1
]}

Xiao, P. ^{[1
]}

机构：

[1] Univ Manchester, Sch Mat, Ctr Mat Sci, Manchester M1 7HS, Lancs, England

来源：

SURFACE & COATINGS TECHNOLOGY | 2006年 / 201卷 / 3-4期

基金：

英国工程与自然科学研究理事会;

关键词：

thermal barrier coatings; stresses; Young's modulus; photoluminescence piezospectroscopy; indentation;

D O I：

10.1016/j.surfcoat.2006.01.035

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

Residual stresses in electron beam physical vapour deposition (EB-PVD) thermal barrier coatings (TBCs) have been measured by photoluminescence piezospectroscopy (PLPS). It was found that the macro-stress, caused by the thermal mismatch between the substrate and the coating, decreases from the TBC/TGO interface to the top surface. The Young's modulus, measured on the cross-section of EB-PVD coating by nano-indentation, was also found to decrease from TBC/TGO interface to top surface. The variation of Young's modulus can be explained by change in the contact area of TBC under macro-stress. A model was employed to examine the contact area in relation to the stresses. And the stresses estimated based on results from nano-indentation measurements showed the same trend as that obtained from PLPS. (c) 2006 Elsevier B.V. All rights reserved.

引用

页码：1124 / 1131

页数：8

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