Topology-Driven Reliability Assessment of Integrated Circuits

被引：0

作者：

Hillebrand, Theodor ^{[1
]}

Paul, Steffen ^{[1
]}

Peters-Drolshagen, Dagmar ^{[1
]}

机构：

[1] Univ Bremen, Bremen, Germany

来源：

PROCEEDINGS OF THE 25TH INTERNATIONAL CONFERENCE MIXED DESIGN OF INTEGRATED CIRCUITS AND SYSTEM (MIXDES 2018) | 2018年

关键词：

HCD; BTI; CMOS; Analog Design; Reliability; Topology;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

In this paper a structured method is presented which optimizes integrated analogue circuits in terms of aging. The aging analyses of each sub block used in the method are presented. Subsequently, these blocks are used to improve the aging behavior of a two-stage Miller-OTA. Moreover, the whole capabilities of the method are evaluated constructing an aging-compensated amplifier from scratch being virtually immune to aging.

引用

页码：198 / 203

页数：6