Direct determination of elastic strains and dislocation densities in individual subgrains in deformation structures

被引：69
作者：
Jakobsen, Bo
Poulsen, Henning F.
Lienert, Ulrich
Pantleon, Wolfgang [1 ]
机构：
[1] Riso Natl Lab, Ctr Fundamental Res Met Struct Four Dimens, Mat Res Dept, DK-4000 Roskilde, Denmark
[2] Argonne Natl Lab, Adv Photon Source, Argonne, IL 60439 USA
来源：
ACTA MATERIALIA | 2007年 / 55卷 / 10期
关键词：
X-ray diffraction (XRD); copper; dislocation structure; line broadening; plastic deformation;
D O I：
10.1016/j.actamat.2007.01.049
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
A novel synchrotron-based technique "high angular resolution 3DXRD" is presented in detail, and applied to the characterization of oxygen-free, high-conductivity copper at a tensile deformation of 2%. The position and shape in reciprocal space of 14 peaks originating from deeply embedded individual subgrains is reported. From this dataset the density of redundant dislocations in the individual subgrains is inferred to be below 12 x 10(12) m(-2) on average. It is found that the subgrains on average experience a reduction in strain of 0.9 x 10(-4) with respect to the mean elastic strain of the full grain, a rather wide distribution of the strain difference between the subgrains (twice the standard deviation is 2.9 x 10(-4)), and a narrow internal strain distribution (upper limit is 2.4 x 10(-4) full width at half maximum). (C) 2007 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.
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收藏
页码：3421 / 3430
页数：10
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