Wafer-level flip chip packages using preapplied anisotropic conductive films (ACFs)

被引:15
作者
Son, Ho-Young [1 ]
Chung, Chang-Kyu
Yim, Myung-Jin
Hwang, Jin-Sang
Paik, Kyung-Wook
Jung, Gi-Jo
Lee, Jun-Kyu
机构
[1] Korea Adv Inst Sci & Technol, Dept Mat Sci & Engn, Taejon 305701, South Korea
[2] Georgia Inst Technol, Sch Mat Sci & Engn, Atlanta, GA 30332 USA
[3] NEPES Corp, Chungchungbuk 363883, South Korea
来源
IEEE TRANSACTIONS ON ELECTRONICS PACKAGING MANUFACTURING | 2007年 / 30卷 / 03期
关键词
anisotropic conductive film (ACF) prelamination; flip chip assembly; reliability; wafer-level flip chip packages; wafer-level package;
D O I
10.1109/TEPM.2007.899151
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Recently, wafer-level packaging (WLP) has become one of the promising packaging technologies due to its advantages, such as fewer processing steps, lower cost, and enhanced device performance compared to conventional single-chip packaging. Many developments on new WLP design, material, and process have been accomplished according to performance and reliability requirement of the devices to be packaged [11, [2]. For a lower cost, higher performance, and environmentally green packaging process, anisotropic conductive film (ACF) flip chip assembly has been widely used, such as in ultrafine-pitch flat panel display (FPD) and general semiconductor packaging applications, too. However, there has been no previous attempt on the wafer-level flip chip assembly using ACFs. In this paper, wafer-level flip chip packages using preapplied ACFs were investigated. After ACF prelamination on an electroplated An bumped wafer, and subsequent singulation, singulated chips were flip-chip assemble on an organic substrate using a thermocompression bonding method. Au-plated bumps were well assembled on Ni/Au pads of organic substrates. The electrical, mechanical properties and the reliabilities of wafer-level flip chip assemblies (WL-FCAs) were evaluated and compared with conventional ACF flip chip assemblies using the thermocompression method. Contact resistance measurement was performed after thermal cycling, high temperature/humidity, and pressure cooker test. ACF joints between electroplated An bumps and substrate metal pads showed stable contact resistance of 5 mn per a bump, strong bump adhesion, and similar reliability behaviors compared with conventional ACF flip chip joints using a thermocompression bonding. As a summary, new wafer-level packages using preapplied ACFs were successfully demonstrated for flip chip assembly. The new wafer-level packages using preapplied ACFs can be widely used for many nonsolder flip chip assembly applications such as chip-on-board (COB), chip-on-flex (COF), and chip-on-glass (COG).
引用
收藏
页码:221 / 227
页数:7
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