Effects of trace elements (Y and Ca) on the eutectic Ge in Al-Ge based alloys

被引:12
作者
Li, J. H. [1 ]
Wanderka, N. [2 ]
Balogh, Z. [3 ]
Stender, P. [3 ]
Kropf, H. [2 ]
Albu, M. [4 ]
Tsunekawa, Y. [5 ]
Hofer, F. [4 ]
Schmitz, G. [3 ]
Schumacher, P. [1 ,6 ]
机构
[1] Univ Leoben, Inst Casting Res, A-8700 Leoben, Austria
[2] Helmholtz Zentrum Berlin Mat & Energie GmbH, Hahn Meitner Plate 1, D-14109 Berlin, Germany
[3] Univ Stuttgart, Inst Mat Wissensch, Heisenbergstr 3, D-70569 Stuttgart, Germany
[4] Graz Univ Technol, Graz Ctr Electron Microscopy, Inst Electron Microscopy & Nanoanal, A-8010 Graz, Austria
[5] Toyota Technol Inst, Tempaku Ku, Hisakata 2-12-1, Nagoya, Aichi 4688511, Japan
[6] Austrian Foundry Res Inst, Leoben, Austria
关键词
Al-Ge alloy; Segregation; Solute entrainment; Eutectic solidification; HAADF-STEM; Atom probe tomography; SILICON; SI; ALUMINUM; GROWTH; STRONTIUM;
D O I
10.1016/j.actamat.2016.03.043
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Effects of trace elements (0.2Y and 0.2Ca (wt%) on the eutectic Ge in high purity Al-20Ge (wt%) alloys were investigated by multi-scale microstructure characterization techniques. Particularly, the distribution of trace elements (Y and Ca) within the eutectic Ge and/or at the interface between eutectic Ge and eutectic Al was investigated by atomic resolution high angle annular dark field scanning transmission electron microscopy (HAADF-STEM) imaging and atom probe tomography (APT). The combined investigations indicate Al-Y and Al-Ca co-segregations. Such co-segregations change significant morphology and growth of the eutectic Ge. In addition, large Al2Ge2Y and Al2Ge2Ca phases were also measured. The modification of eutectic Ge is discussed in terms of previously postulated modification mechanisms: twin plane re-entrant edge growth mechanism, impurity-induced twinning, and growth restriction of eutectic Ge. (C) 2016 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.
引用
收藏
页码:85 / 95
页数:11
相关论文
共 24 条
[1]  
[Anonymous], 1921, U. S. Patent, Patent No. [1,387,900, 1387900]
[2]  
[Anonymous], 1998, FUNDAMENTALS SOLIDIF
[3]   Comparison of segregations formed in unmodified and Sr-modified Al-Si alloys studied by atom probe tomography and transmission electron microscopy [J].
Barrirero, Jenifer ;
Engstler, Michael ;
Ghafoor, Naureen ;
de Jonge, Niels ;
Oden, Magnus ;
Muecklich, Frank .
JOURNAL OF ALLOYS AND COMPOUNDS, 2014, 611 :410-421
[4]   MICROSTRUCTURE AND CRYSTALLOGRAPHY OF ALUMINIUM-SILICON EUTECTIC ALLOYS [J].
DAY, MG ;
HELLAWELL, A .
PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1968, 305 (1483) :473-+
[5]   Precipitation of aluminum in the silicon phase contained in W319 and 356 aluminum alloys [J].
Donlon, WT .
METALLURGICAL AND MATERIALS TRANSACTIONS A-PHYSICAL METALLURGY AND MATERIALS SCIENCE, 2003, 34 (03) :523-529
[6]  
Edington J.W., 1991, PRACTICAL ELECT MICR
[7]  
Goldstein J.I., 1986, DISPERSIVE SPECTRA P, P155
[8]   PROPAGATION MECHANISM OF GERMANIUM DENDRITES [J].
HAMILTON, DR ;
SEIDENSTICKER, RG .
JOURNAL OF APPLIED PHYSICS, 1960, 31 (07) :1165-1168
[9]   GROWTH AND STRUCTURE OF EUTECTICS WITH SILICON AND GERMANIUM [J].
HELLAWELL, A .
PROGRESS IN MATERIALS SCIENCE, 1970, 15 (01) :3-+
[10]   On nanoscale Al precipitates forming in eutectic Si particles in Al-Si-Mg cast alloys [J].
Jia, Z. H. ;
Arnberg, L. ;
Andersen, S. J. ;
Walmsley, J. C. .
SCRIPTA MATERIALIA, 2009, 61 (05) :500-503