Total dose test of commercial off-the-shelf components to be used in power supply for space experiments

被引：0

作者：

Menichelli, M ^{[1
]}

Battiston, R ^{[1
]}

Bizzaglia, S ^{[1
]}

Blasko, S ^{[1
]}

Castellini, G ^{[1
]}

Di Masso, L ^{[1
]}

Gabbanini, M ^{[1
]}

Papi, A ^{[1
]}

Scolieri, G ^{[1
]}

Tesi, A ^{[1
]}

机构：

[1] Ist Nazl Fis Nucl, I-06100 Perugia, Italy

来源：

1999 IEEE NUCLEAR SCIENCE SYMPOSIUM - CONFERENCE RECORD, VOLS 1-3 | 1999年

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Commercial off-the-shelf components have been tested for their use on the power supplies of the AMS and PAMELA experiments. The test has been performed using the CALLIOPE Co60 source at the Casaccia (Rome -Italy) Laboratory of ENEA according to the ESA/SCC 22900 specifications. The total dose for this test was 30 krads. Measurements of relevant parameters for each component has been taken at 3, 10 and 30 krads. Annealing and ageing has also been perfomed according to the ESA specification. The results on the degradation of performaces in discrete transistors, Op-Amps, regulators and other analog and digital components are reported.

引用

页码：408 / 413

页数：2