Measured stark widths and shifts of neutral silicon spectral lines

被引：9

作者：

Sreckovic, A ^{[1
]}

Bukvic, S ^{[1
]}

Djenize, S ^{[1
]}

机构：

[1] Univ Belgrade, Fac Phys, YU-11001 Belgrade, Yugoslavia

来源：

PHYSICA SCRIPTA | 1998年 / 57卷 / 02期

关键词：

D O I：

10.1088/0031-8949/57/2/012

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

Stark widths and shifts of five Si I line were measured at 28 500 K electron temperature and 1.9 x 10(23)m(-3) electron density in a linear, low-pressure, pulsed are operated in argon-helium mixture. Our data are compared with values calculated on the basis of quasistatic approximation.

引用

页码：225 / 227

页数：3

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