Tactile Sensing Using Machine Learning-Driven Electrical Impedance Tomography

被引:17
|
作者
Husain, Zainab [1 ]
Madjid, Nadya Abdel [1 ]
Liatsis, Panos [1 ]
机构
[1] Khalifa Univ Sci & Technol, Dept Elect Engn & Comp Sci, Abu Dhabi, U Arab Emirates
关键词
Sensors; Image reconstruction; Voltage measurement; Image segmentation; Shape; Object recognition; Conductivity; Electrical impedance tomography; tactile sensing; image reconstruction; segmentation; object recognition; IMAGE-RECONSTRUCTION; CONTACT IMPEDANCE; EIT; CLASSIFICATION; RECOGNITION; SEGMENTATION; SENSORS; IMPACT; TOUCH; SHAPE;
D O I
10.1109/JSEN.2021.3054870
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Electrical Impedance Tomography (EIT) tactile sensors have limited success in equipping robots with tactile sensing capabilities due to the low spatial resolution of the resulting tactile images and the presence of image artifacts. To address these limitations, we propose a modular framework for invariant recognition of objects, within the context of an EIT artificial skin sensor. Three interconnected problems, i.e., EIT image reconstruction, segmentation and object recognition, are tackled in this work with the aid of machine learning. A novel conductivity surface decomposition approach, based on low order bivariate polynomials and RBF networks is introduced for the efficient solution of the EIT inverse problem. Next, segmentation of the reconstructed images is performed using a convolutional neural network and transfer learning. Finally, a subspace KNN ensemble classifier is trained on the set of object descriptors extracted from the segmented inhomogeneities to classify the objects. The proposed framework provides an accuracy of 97.5% on unseen data.
引用
收藏
页码:11628 / 11642
页数:15
相关论文
共 50 条
  • [41] LEARNING SPARSIFYING TRANSFORMS FOR IMAGE RECONSTRUCTION IN ELECTRICAL IMPEDANCE TOMOGRAPHY
    Yang, Kaiyi
    Borijindargoon, Narong
    Ng, Boon Poh
    Ravishankar, Saiprasad
    Wen, Bihan
    2021 IEEE INTERNATIONAL CONFERENCE ON ACOUSTICS, SPEECH AND SIGNAL PROCESSING (ICASSP 2021), 2021, : 1405 - 1409
  • [42] Fast electrical impedance tomography based on sparse Bayesian learning
    Wang, Nan
    Li, Yang
    Zhao, Peng-Fei
    Huang, Lan
    Wang, Zhong-Yi
    APPLIED SOFT COMPUTING, 2023, 143
  • [43] A feasibility study of magnetic resonance driven electrical impedance tomography using a phantom
    Wan, Yuqing
    Negishi, Michiro
    Constable, R. Todd
    PHYSIOLOGICAL MEASUREMENT, 2013, 34 (06) : 623 - 644
  • [44] Efficient Multitask Structure-Aware Sparse Bayesian Learning for Frequency-Difference Electrical Impedance Tomography
    Liu, Shengheng
    Huang, Yongming
    Wu, Hancong
    Tan, Chao
    Jia, Jiabin
    IEEE TRANSACTIONS ON INDUSTRIAL INFORMATICS, 2021, 17 (01) : 463 - 472
  • [45] Measurement of angular velocities using electrical impedance tomography
    Etuke, EO
    Bonnecaze, RT
    FLOW MEASUREMENT AND INSTRUMENTATION, 1998, 9 (03) : 159 - 169
  • [46] Flexible tactile sensing of magnetic hydrogel composites based on electrical impedance tomography
    Li, Bin
    Yang, Xuanxuan
    Chen, Haofeng
    Xu, Chanchan
    Wang, Xiaojie
    JOURNAL OF INTELLIGENT MATERIAL SYSTEMS AND STRUCTURES, 2024,
  • [47] Precise damage shaping in self-sensing composites using electrical impedance tomography and genetic algorithms
    Hassan, Hashim
    Tallman, Tyler N.
    STRUCTURAL HEALTH MONITORING-AN INTERNATIONAL JOURNAL, 2023, 22 (01): : 372 - 387
  • [48] ELECTRICAL IMPEDANCE TOMOGRAPHY, ENCLOSURE METHOD AND MACHINE LEARNING
    Siltanen, Samuli
    Ide, Takanori
    PROCEEDINGS OF THE 2020 IEEE 30TH INTERNATIONAL WORKSHOP ON MACHINE LEARNING FOR SIGNAL PROCESSING (MLSP), 2020,
  • [49] Optimizing Electrode Positions in 2-D Electrical Impedance Tomography Using Deep Learning
    Smyl, Danny
    Liu, Dong
    IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2020, 69 (09) : 6030 - 6044
  • [50] Bladder Boundary Estimation by Gravitational Search Algorithm Using Electrical Impedance Tomography
    Sharma, Sunam Kumar
    Konki, Sravan Kumar
    Khambampati, Anil Kumar
    Kim, Kyung Youn
    IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2020, 69 (12) : 9657 - 9667