LOW-FREQUENCY NOISE MEASUREMENT OF A HIGHLY STABLE CHARGE-METER

被引：0

作者：

Nihtianov, Stoyan ^{[1
]}

Guo, Xiaodong ^{[2
]}

机构：

[1] ASML Netherlands BV, Run 6501, NL-5504 DR Veldhoven, Netherlands

[2] Delft Univ Technol, Dept Elect Instrumentat Lab, \, NL-2628 CD Delft, Netherlands

来源：

2009 AFRICON, VOLS 1 AND 2 | 2009年

关键词：

low-frequency noise; stability; charge-meter; drift;

D O I：

暂无

中图分类号：

TP301 [理论、方法];

学科分类号：

081202 ;

摘要：

A successful effort is reported on an accurate measurement of the low-frequency (1/f) noise and the thermal stability of the charge-meter presented in [1]. These two parameters are very important for the charge-meter, as its main application is to interface capacitive sensors with extremely high long-term stability and low thermal drift. A measurement strategy for the low-frequency noise behavior of the charge-meter is reported. A particular test setup was built and a special test strategy was created to reduce the different kinds of external low-frequency interference to a minimum. This allowed the low-frequency component of the intrinsic input noise of the charge-meter to be measured accurately. An extremely low value of the low-frequency (1/f) noise with corner frequency 2 mHz, and a very high thermal stability of 2 ppm/K of the charge-meter, are reported.

引用

页码：113 / 118

页数：6

共 50 条

[21] Low-frequency noise measurement-based reliability testing of VLSI interconnects with different geometry
Rawat, KS
Massiha, GH
IEEE ELECTRON DEVICE LETTERS, 2004, 25 (12) : 781 - 783
[22] Measurement and analysis of low-frequency noise in large capacity high voltage aluminum electrolytic capacitors
Wu Yong
Ma Zhongfa
Du Lei
He Liang
2014 15TH INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY (ICEPT), 2014, : 1127 - 1132
[23] Low-frequency noise in single growth planar separate absorption, grading, charge, and multiplication avalanche photodiodes
An, S
Deen, MJ
IEEE TRANSACTIONS ON ELECTRON DEVICES, 2000, 47 (03) : 537 - 543
[24] LOW-FREQUENCY IMAGE NOISE REMOVAL USING WHITE NOISE FILTER
Rakhshanfar, Meisam
Amer, Maria A.
2018 25TH IEEE INTERNATIONAL CONFERENCE ON IMAGE PROCESSING (ICIP), 2018, : 3948 - 3952
[25] THE CHARGE CARRIER CAPTURE-EMISSION PROCESS - THE MAIN SOURCE OF THE LOW-FREQUENCY NOISE IN HOMOGENEOUS SEMICONDUCTORS
Palenskis, V.
LITHUANIAN JOURNAL OF PHYSICS, 2016, 56 (04): : 200 - 206
[26] Low-Frequency Noise in InGaAs-OI Transistors
Marquez, Carlos
Navarro, Carlos
Karg, Siegfried
Ortega, Ruben
Zota, Cezar
Gamiz, Francisco
IEEE TRANSACTIONS ON ELECTRON DEVICES, 2024, 71 (06) : 3964 - 3969
[27] Impact of geometrical scaling on low-frequency noise in SiGeHBTs
Jin, ZR
Cressler, JD
Niu, GF
Joseph, AJ
IEEE TRANSACTIONS ON ELECTRON DEVICES, 2003, 50 (03) : 676 - 682
[28] Multiplicative and Additive Low-Frequency Noise in Microwave Transistors
Weinreb, Sander
Schleeh, Joel
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 2014, 62 (01) : 83 - 91
[29] Effects of Low-Frequency Noise in Crossflow Transition Control
Guo, Zhengfei
Kloker, Markus J.
AIAA JOURNAL, 2020, 58 (03) : 1068 - 1078
[30] Impact of RF stress on the low-frequency noise in nMOSFETs
Fu, Haipeng
Niu, Muqian
Yang, Liping
Li, Xuguang
Ma, Kaixue
IEICE ELECTRONICS EXPRESS, 2021, 18 (14):

← 1 2 3 4 5 →