Size-dependent adhesion of nanoparticles on rough substrates

被引：35

作者：

Chow, TS ^{[1
]}

机构：

[1] Xerox Corp, Joseph C Wilson Ctr Technol, Webster, NY 14580 USA

来源：

JOURNAL OF PHYSICS-CONDENSED MATTER | 2003年 / 15卷 / 02期

关键词：

D O I：

10.1088/0953-8984/15/2/111

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

When the size of particles varies over the entire realm of nanotechnology, we find that surface forces can change by orders of magnitude depending on how surface interactions are influenced by the irregular fluctuations of rough surfaces at all length scales from atoms to microns. The length scales and roughness exponent define the distribution of asperities at points of contact and the adhesion that is maintained by van der Waals forces and contact deformation via asperities.

引用

页码：L83 / L87

页数：5

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