Texture formation in extruded rods of (Bi,Sb)2(Te,Se)3 thermoelectric alloys.

被引:0
作者
Vasilevskiy, D [1 ]
Simard, JM [1 ]
Bélanger, F [1 ]
Bernier, F [1 ]
Turenne, S [1 ]
L'Ecuyer, J [1 ]
机构
[1] Ecole Polytech Montreal, Montreal, PQ, Canada
来源
XXI INTERNATIONAL CONFERENCE ON THERMOELECTRICS, PROCEEDINGS ICT '02 | 2002年
关键词
D O I
暂无
中图分类号
O414.1 [热力学];
学科分类号
摘要
The anisotropy in both the electrical and mechanical properties of (Bi,Sb)(2)(Te,Se)(3) thermoelectric alloys, and in turn in their overall performance, requires a close control of the alloy texture. In this work we have investigated extruded rods of n- and p- type thermoelectric alloys with square (25.4 mm x 25.4 mm) and circular (25.4 mm diameter) cross-sections. Figures of merit of up to 3.2 x 10(-3) K-1 for p-type alloys and 2.8 x 10(-3) K-1 for n-type alloys have been obtained for all extruded sizes. Texture investigations were made by X-ray diffraction. Electrical characterization and mechanical strength were measured in the longitudinal and radial directions. Comparison of the experimental data with numerical simulations shows that there is a correlation between the sample texture and the value of the equivalent plastic strain experienced by the material during the hot extrusion process.
引用
收藏
页码:24 / 27
页数:4
相关论文
共 8 条
[1]  
BELANGER F, 2001, ADV POWER METALLUR 9, P88
[2]  
COOK BA, 1994, HDB THERMOELECTRICS, P125
[3]  
DIETER GE, 1986, MECH METALLURGY, P88
[4]  
GOLDSMID HJ, 1986, ELECT REFRIGERATION, P89
[5]   MECHANICAL ALLOYING OF BITE AND BISBTE THERMOELECTRIC-MATERIALS [J].
HASEZAKI, K ;
NISHIMURA, M ;
UMATA, M ;
TSUKUDA, H ;
ARAOKA, M .
MATERIALS TRANSACTIONS JIM, 1994, 35 (06) :428-432
[6]   TOPOTACTICAL REACTIONS WITH FERRIMAGNETIC OXIDES HAVING HEXAGONAL CRYSTAL STRUCTURES .1. [J].
LOTGERING, FK .
JOURNAL OF INORGANIC & NUCLEAR CHEMISTRY, 1959, 9 (02) :113-+
[7]  
Scherrer H., 1994, HDB THERMOELECTRICS, P211
[8]   Production of thermoelectric materials by mechanical alloying - Extrusion process [J].
Simard, JM ;
Vasilevskiy, D ;
Belanger, F ;
L'Ecuyer, J ;
Turenne, S .
TWENTIETH INTERNATIONAL CONFERENCE ON THERMOELECTRICS, PROCEEDINGS, 2001, :132-135