Effect of film thickness on the properties of indium tin oxide thin films

Transparent conducting indium tin oxide (ITO) thin films (40-870 nm) were grown by pulsed laser deposition on amorphous substrates and the structural, electrical, and optical properties of these films were investigated. Films were deposited using a KrF excimer laser (248 nm, 30 ns FWHM) at a fluence of 2 J/cm(2), at substrate temperature of 300 degreesC and 10 mTorr of oxygen pressure. For ITO films (30-400 nm thickness) deposited at 300 degreesC in 10 mTorr of oxygen, a resistivity of 1.8-2.5x10(-4) Omega cm was observed and the average transmission in the visible range (400-700 nm) was about 85%-90%. The Hall mobility and carrier density for ITO films (40-870 nm thickness) were observed to be in the range of 24-27 cm(2)/V s and 8-13x10(20) cm(-3), respectively. The ITO films have been used as the anode contact in organic light emitting diodes and the effect of ITO film thickness on the device performance has been studied. The optimum thickness of the ITO anode for the maximum device efficiency was observed to be about 60-100 nm. The device with the optimum thickness of ITO anode showed an external quantum efficiency of about 0.85% at 100 A/m(2). (C) 2000 American Institute of Physics. [S0021-8979(00)08622-9].