EXACT RUN LENGTH DISTRIBUTION OF THE DOUBLE SAMPLING (X)over-bar CHART WITH ESTIMATED PROCESS PARAMETERS

被引:10
作者
Teoh, W. L. [1 ]
Fun, M. S. [1 ]
Teh, S. Y. [2 ]
Khoo, Michael B. C. [3 ]
Yeong, W. C. [3 ]
机构
[1] Univ Tunku Abdul Rahman, Dept Phys & Math Sci, Fac Sci, Kampar, Perak, Malaysia
[2] Univ Sains Malaysia, Sch Management, Minden 11800, Penang, Malaysia
[3] Univ Sains Malaysia, Sch Math Sci, Minden 11800, Penang, Malaysia
来源
SOUTH AFRICAN JOURNAL OF INDUSTRIAL ENGINEERING | 2016年 / 27卷 / 01期
关键词
ECONOMIC DESIGN;
D O I
10.7166/27-1-978
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Since the run length distribution is generally highly skewed, a significant concern about focusing too much on the average run length (ARL) criterion is that we may miss some crucial information about a control chart's performance. Thus it is important to investigate the entire run length distribution of a control chart for an in-depth understanding before implementing the chart in process monitoring. In this paper, the percentiles of the run length distribution for the double sampling (DS) (X) over bar chart with estimated process parameters are computed. Knowledge of the percentiles of the run length distribution provides a more comprehensive understanding of the expected behaviour of the run length. This additional information includes the early false alarm, the skewness of the run length distribution, and the median run length (MRL). A comparison of the run length distribution between the optimal ARL-based and MRL-based DS (X) over bar chart with estimated process parameters is presented in this paper. Examples of applications are given to aid practitioners to select the best design scheme of the DS (X) over bar chart with estimated process parameters, based on their specific purpose.
引用
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页码:20 / 31
页数:12
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