Methods of resolution enhancement of laser diameter measuring instruments

被引：10

作者：

Chursin, Yury A. ^{[1
]}

Fedorov, Evgeny M. ^{[1
]}

机构：

[1] Natl Res Tomsk Polytech Univ, Tomsk 634050, Russia

来源：

OPTICS AND LASER TECHNOLOGY | 2015年 / 67卷

关键词：

In-process diameter measurement; Diffraction; Spectral analysis; METAL CYLINDERS; DIFFRACTION;

D O I：

10.1016/j.optlastec.2014.09.017

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

The paper presents the implementation of diffraction and spectral analysis methods allowing 1 mu m resolution enhancement of optical instruments intended for measurements of such round wire materials as cables, wires, cords, etc. with diameters exceeding the wavelength (similar to 0.5 mm and large). The transformation function suggested allows detecting geometrical boundaries of object's shadows that are used to calculate its diameter independently from its location in the gaging zone. The real-time detection algorithm is described for diffraction extreme values in the analog video signal produced by the charge-coupled device sensors. A method of additional improvement of resolution is shown on the basis of spectral analysis. (C) 2014 Elsevier Ltd. All rights reserved.

引用

页码：86 / 92

页数：7

共 19 条

[1]

[Anonymous], 2002, Patent N, Patent No. [EP 0924493 B1, 0924493]

[2] FRESNEL DIFFRACTION OF A GAUSSIAN LASER-BEAM BY POLISHED METAL CYLINDERS [J].