Large area strain analysis using scanning transmission electron microscopy across multiple images

被引：37

作者：

Oni, A. A. ^{[1
]}

Sang, X. ^{[1
]}

Raju, S. V. ^{[2
]}

Dumpala, S. ^{[3
]}

Broderick, S. ^{[3
]}

Kumar, A. ^{[4
]}

Sinnott, S. ^{[4
]}

Saxena, S. ^{[2
]}

Rajan, K. ^{[3
]}

LeBeau, J. M. ^{[1
]}

机构：

[1] N Carolina State Univ, Dept Mat Sci & Engn, Raleigh, NC 27695 USA

[2] Florida Int Univ, Ctr Study Matter Extreme Condit, Miami, FL 33199 USA

[3] Iowa State Univ, Dept Mat Sci & Engn, Ames, IA 50011 USA

[4] Univ Florida, Dept Mat Sci & Engn, Gainesville, FL 32611 USA

来源：

APPLIED PHYSICS LETTERS | 2015年 / 106卷 / 01期

基金：

美国国家科学基金会;

关键词：

LOCAL LATTICE-DISTORTIONS; DIFFRACTION; SUPERALLOYS; DISPLACEMENT; CONTRAST; MISMATCH;

D O I：

10.1063/1.4905368

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Here, we apply revolving scanning transmission electron microscopy to measure lattice strain across a sample using a single reference area. To do so, we remove image distortion introduced by sample drift, which usually restricts strain analysis to a single image. Overcoming this challenge, we show that it is possible to use strain reference areas elsewhere in the sample, thereby enabling reliable strain mapping across large areas. As a prototypical example, we determine the strain present within the microstructure of a Ni-based superalloy directly from atom column positions as well as geometric phase analysis. While maintaining atomic resolution, we quantify strain within nanoscale regions and demonstrate that large, unit-cell level strain fluctuations are present within the intermetallic phase. (C) 2015 AIP Publishing LLC.

引用

页数：4

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