Large area strain analysis using scanning transmission electron microscopy across multiple images

被引：37

作者：

Oni, A. A. ^{[1
]}

Sang, X. ^{[1
]}

Raju, S. V. ^{[2
]}

Dumpala, S. ^{[3
]}

Broderick, S. ^{[3
]}

Kumar, A. ^{[4
]}

Sinnott, S. ^{[4
]}

Saxena, S. ^{[2
]}

Rajan, K. ^{[3
]}

LeBeau, J. M. ^{[1
]}

机构：

[1] N Carolina State Univ, Dept Mat Sci & Engn, Raleigh, NC 27695 USA

[2] Florida Int Univ, Ctr Study Matter Extreme Condit, Miami, FL 33199 USA

[3] Iowa State Univ, Dept Mat Sci & Engn, Ames, IA 50011 USA

[4] Univ Florida, Dept Mat Sci & Engn, Gainesville, FL 32611 USA

来源：

APPLIED PHYSICS LETTERS | 2015年 / 106卷 / 01期

基金：

美国国家科学基金会;

关键词：

LOCAL LATTICE-DISTORTIONS; DIFFRACTION; SUPERALLOYS; DISPLACEMENT; CONTRAST; MISMATCH;

D O I：

10.1063/1.4905368

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Here, we apply revolving scanning transmission electron microscopy to measure lattice strain across a sample using a single reference area. To do so, we remove image distortion introduced by sample drift, which usually restricts strain analysis to a single image. Overcoming this challenge, we show that it is possible to use strain reference areas elsewhere in the sample, thereby enabling reliable strain mapping across large areas. As a prototypical example, we determine the strain present within the microstructure of a Ni-based superalloy directly from atom column positions as well as geometric phase analysis. While maintaining atomic resolution, we quantify strain within nanoscale regions and demonstrate that large, unit-cell level strain fluctuations are present within the intermetallic phase. (C) 2015 AIP Publishing LLC.

引用

页数：4

共 21 条

[1] DIFFRACTION CONTRAST FROM SPHERICALLY SYMMETRICAL COHERENCY STRAINS
ASHBY, MF
BROWN, LM
[J]. PHILOSOPHICAL MAGAZINE, 1963, 8 (91): : 1083 - &
[2] Strain measurement at the nanoscale: Comparison between convergent beam electron diffraction, nano-beam electron diffraction, high resolution imaging and dark field electron holography
Beche, A.
Rouviere, J. L.
Barnes, J. P.
Cooper, D.
[J]. ULTRAMICROSCOPY, 2013, 131 : 10 - 23
[3] Chromium and tantalum site substitution patterns in Ni3Al (L12) γ′-precipitates
Booth-Morrison, Christopher
Mao, Zugang
Noebe, Ronald D.
Seidman, David N.
[J]. APPLIED PHYSICS LETTERS, 2008, 93 (03)
[4] THE APPLICATION OF CONVERGENT-BEAM ELECTRON-DIFFRACTION TO THE DETECTION OF SMALL SYMMETRY CHANGES ACCOMPANYING PHASE-TRANSFORMATIONS .1. GENERAL AND METHODS
ECOB, RC
SHAW, MP
PORTER, AJ
RALPH, B
[J]. PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1981, 44 (05): : 1117 - 1133
[5] THE MEASUREMENT OF PRECIPITATE MATRIX LATTICE MISMATCH IN NICKEL-BASE SUPER-ALLOYS
ECOB, RC
RICKS, RA
PORTER, AJ
[J]. SCRIPTA METALLURGICA, 1982, 16 (09): : 1085 - 1090
[6] Geddes B., 2010, Superalloys: alloying and performance
[7] Calibration of projector lens distortions
Hüe, F
Johnson, CL
Lartigue-Korinek, S
Wang, G
Buseck, PR
Hytch, MJ
[J]. JOURNAL OF ELECTRON MICROSCOPY, 2005, 54 (03): : 181 - 190
[8] Quantitative measurement of displacement and strain fields from HREM micrographs
Hytch, MJ
Snoeck, E
Kilaas, R
[J]. ULTRAMICROSCOPY, 1998, 74 (03) : 131 - 146
[9] Imaging conditions for reliable measurement of displacement and strain in high-resolution electron microscopy
Hytch, MJ
Plamann, T
[J]. ULTRAMICROSCOPY, 2001, 87 (04) : 199 - 212
[10] THE USE OF CONVERGENT-BEAM ELECTRON-DIFFRACTION TO DETERMINE LOCAL LATTICE-DISTORTIONS IN NICKEL-BASE SUPERALLOYS
KAUFMAN, MJ
PEARSON, DD
FRASER, HL
[J]. PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1986, 54 (01): : 79 - 92

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