Standard uncertainty evaluation in image-based measurements

被引:57
作者
De Santo, M [1 ]
Liguori, C [1 ]
Paolillo, A [1 ]
Pietrosanto, A [1 ]
机构
[1] Univ Salerno, DIIE, I-84084 Fisciano, SA, Italy
关键词
uncertainty; errors; image based measurements analytical models;
D O I
10.1016/j.measurement.2004.09.011
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The present paper is devoted to address the use and evaluation of measures coming from digital images in an industrial context. Starting from a discussion about the importance and role of this class of measurements, the authors show the architecture of an image-based measurement system and introduce the important issue of the related uncertainty then coming to investigate models and methods for evaluating it. After presenting an original method for evaluating the uncertainty of images deriving measurements, some examples of practical interest are introduced and evaluated leading the reader to the understanding of related problems. The paper is also enriched by the presence of an introductive section discussing a bibliography of the state of the art in the field. (C) 2004 Elsevier Ltd. All rights reserved.
引用
收藏
页码:347 / 358
页数:12
相关论文
共 23 条
[1]  
Angrisani L., 1999, Measurement, V25, P169, DOI 10.1016/S0263-2241(98)00076-1
[2]   Structured approach to estimate the measurement uncertainty in digital signal elaboration algorithms [J].
Betta, G ;
Liguori, C ;
Pietrosanto, A .
IEE PROCEEDINGS-SCIENCE MEASUREMENT AND TECHNOLOGY, 1999, 146 (01) :21-26
[3]  
Boccignone G., 1996, Theory and Practice of Object Systems, V2, P227, DOI 10.1002/(SICI)1096-9942(1996)2:4<227::AID-TAPO1>3.0.CO
[4]  
2-R
[5]   Uncertainty characterization in image-based measurements: A preliminary discussion [J].
De Santo, M ;
Liguori, C ;
Pietrosanto, A .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2000, 49 (05) :1101-1107
[6]  
DENNIS JE, 1996, NUMERICAL METHODS UN
[7]  
DORST L, 1984, IEEE T PATTERN ANAL, V6
[8]  
Fletcher R., 1981, PRACTICAL METHODS OP
[9]  
HAVELOCK DI, 1989, IEEE T PATTERN ANAL, V11
[10]  
HO C, 1983, IEEE T PATTERN ANAL, V5