The Second-order SPM Solution for Scattering from Multi-layer Dielectric Media with Slightly Rough Surface

被引：0
|
作者：
Lin, Z. W. [1 ]
Zhang, X. J. [1 ]
Fang, G. Y. [1 ]
机构：
[1] Chinese Acad Sci, Inst Elect, Beijing 100864, Peoples R China
来源：
PIERS 2009 MOSCOW VOLS I AND II, PROCEEDINGS | 2009年
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D O I：
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中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The second-order solution of the small perturbation method (SPM) for the scattering from arbitrary layered media with three-dimensional slightly rough surface is derived in this work. The second-order scattering fields and corresponding bistatic scattering coefficients for linear polarized waves are derived respectively. The results are validated against known solution for the case of a single rough surface. Numerical results illustrate the contribution of the second-order solution to the backscattering of the layered structure.
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页码：1387 / 1390
页数：4
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