Effects of high dose proton irradiation on the electrical performance of ZnO Schottky diodes

被引:12
作者
Khanna, R
Ip, K
Allums, KK
Baik, K
Abernathy, CR
Pearton, SJ [1 ]
Heo, YW
Norton, DP
Ren, F
Dwivedi, R
Fogarty, TN
Wilkins, R
机构
[1] Univ Florida, Dept Mat Sci & Engn, Gainesville, FL 32611 USA
[2] Univ Florida, Dept Chem Engn, Gainesville, FL 32611 USA
[3] Prairie View A&M Univ, Ctr Appl Radiat Res, Prairie View, TX 77446 USA
来源
PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE | 2004年 / 201卷 / 12期
关键词
D O I
10.1002/pssa.200409059
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Bulk ZnO Schottky rectifiers with Pt rectifying contacts were exposed to 40 MeV protons at fluences from 5 x 10(9) to 5 x 10(10) cm(2). These doses correspond to that received in more than 10 or 100 years, respectively, in low earth satellite orbit. The reverse breakdown voltage of the ZnO diodes increased from similar to3.2 V (taken at a current density of 0.1 A/cm(2)) in unirradiated devices to similar to3.9 V after the highest proton dose. The effective barrier height decreased with proton dose from 0.37 eV to 0.35 eV while the diode ideality factor increased from 1.8 to 1.9 for the 5 x 10(10) dose. The very high tolerance of the ZnO diodes to high doses of energetic protons suggests that this material is well-suited to applications requiring high radiation tolerance. (C) 2004 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.
引用
收藏
页码:R79 / R82
页数:4
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