High-resolution core-level study of the Ca/Si(111)-(2 X 1) surface

被引：4
作者：
Sakamoto, K [1 ]
Takeyama, W
Zhang, HM
Uhrberg, RIG
机构：
[1] Tohoku Univ, Grad Sch Sci, Dept Phys, Sendai, Miyagi 9808578, Japan
[2] Linkoping Univ, Dept Phys & Measurement Technol, S-58183 Linkoping, Sweden
来源：
THIN SOLID FILMS | 2003年 / 428卷 / 1-2期
关键词：
photoelectron spectroscopy; low-energy electron diffraction; surface structure;
D O I：
10.1016/S0040-6090(02)01232-4
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
We have investigated the geometric structure of the Ca/Si(1 1 1)-(2 X 1) surface using low-energy electron diffraction (LEED) and high-resolution core-level photoelectron spectroscopy. A clear (2 X 1) periodicity was observed in LEED after annealing the (7 X 1) phase formed at room temperature in LEED. In the Si 2p core-level spectra, three surface components were observed. By considering the energy shift and intensity of each surface component and the Ca 3p core-levels of the two phases, we regard the (2 X 1) phase to be formed by Tr-bonded Seiwatz Si chains with a Ca coverage of 0.5 ML. (C) 2002 Elsevier Science B.V. All rights reserved.
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收藏
页码：115 / 118
页数：4
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