A new dynamic-XPS end-station for beamline P04 at PETRA III/DESY

被引：9

作者：

Babenkov, SergeyV. ^{[1
]}

Aristov, VictorY. ^{[2
,3
]}

Molodtsova, Olgav. ^{[1
]}

Winkler, Konrad ^{[4
]}

Glaser, Leif ^{[1
]}

Shevchuk, Ivan ^{[1
]}

Scholz, Frank ^{[1
]}

Seltmann, Joern ^{[1
]}

Viefhaus, Jens ^{[1
]}

机构：

[1] Deutsch Elektronen Synchrotron DESY, D-22607 Hamburg, Germany

[2] Russian Acad Sci, Inst Solid State Phys, Chernogolovka 142432, Russia

[3] Univ Hamburg, Inst Theoret Phys, D-20355 Hamburg, Germany

[4] Omicron NanoTechnol GmbH, Taunusstein, Germany

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 2015年 / 777卷

关键词：

Electron spectrometer; Dynamic-XPS; Snapshot; High resolution; PHOTOELECTRON-SPECTROSCOPY; SILICON-CARBIDE; GRAPHENE; FILMS; PHOTOEMISSION; SUBSTRATE; DETECTOR; LINE;

D O I：

10.1016/j.nima.2014.12.065

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

We report on a new dynamic-XPS end-station for real-time investigations of advanced materials. The end-station is based on a new Argus hemispherical electron spectrometer with high speed detection system. In combination with the high brilliance XUV beamline P04 at PETRA Ill it provides users at PETRA Ill a unique tool for fast (down to 0.1 s/spectrum) and detailed investigations compared to existing XPS devices at other beamlines. (C) 2014 Elsevier B.V. All rights reserved,

引用

页码：189 / 193

页数：5

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