High-concentration ozone generator for oxidation of silicon operating at atmospheric pressure

被引:15
|
作者
Koike, K
Fukuda, T
Ichimura, S
Kurokawa, A
机构
[1] Iwatani Int Corp, Shiga Technol Ctr, Moriyama, Shiga 5240041, Japan
[2] Electrotech Lab, Frontier Technol Div, Tsukuba, Ibaraki 3058568, Japan
来源
REVIEW OF SCIENTIFIC INSTRUMENTS | 2000年 / 71卷 / 11期
关键词
D O I
10.1063/1.1310340
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
A high-concentration ozone generator operating at atmospheric pressure was developed to produce ozone for use in fabrication of ultrathin silicon oxide films. A technique for adsorption onto silica gel, in which ozone has adsorption priority over oxygen, was adopted to obtain concentrated ozone. An ozone-oxygen mixture gas generated by a commercial ozonizer is fed in turn to three parallel adsorption columns that are kept at -60 degreesC. After the adsorption process, the ozone-enriched gas is desorbed by a slow warming of the columns from -60 to 0 degreesC and is stored in a storage vessel. Finally, the condensed ozone, at concentrations up to 30 vol % can be supplied continuously to a silicon oxidation chamber at atmospheric pressure and a constant flow rate. Moreover, highly concentrated ozone above 70 vol % can be produced in a batch process by using an additional purification procedure prior to the desorption. We confirmed that even with 25 vol % ozone gas, SiO2 film as thick as 6.3 nm grew on a Si substrate at 600 degreesC and 15 Torr in a 30 min exposure, while under the same experimental conditions only a 3.1 nm thick SiO2 film could be formed on the same substrate with pure oxygen. (C) 2000 American Institute of Physics. [S0034-6748(00)04710-9].
引用
收藏
页码:4182 / 4187
页数:6
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