A 20 dBm fully-integrated 60 GHz SiGe power amplifier with automatic level control

被引:87
作者
Pfeiffer, Ullrich R. [1 ]
Goren, David
机构
[1] IBM Corp, Thomas J Watson Res Ctr, Yorktown Hts, NY 10598 USA
[2] IBM Corp, Res Lab, IL-31905 Haifa, Israel
[3] Technion Israel Inst Technol, IL-32000 Haifa, Israel
关键词
automatic level control; bipolar transistor; built-in self-test; closed-loop power control; mm-wave; power amplifier; power detector; RMS power detector; silicon germanium; 60; GHz;
D O I
10.1109/JSSC.2007.899116
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A +20 dBm power amplifier (PA) for applications in the 60 GHz industrial scientific medical (ISM) band is presented. The PA is fabricated in a 0.13-mu m SiGe BiCMOS process technology and features a fully-integrated on-chip RMS power detector for automatic level control (ALC), build-in self test and voltage standing wave ratio (VSWR) protection. The single-stage push-pull amplifier uses center-tapped microstrips for a highly efficient and compact layout with a core area of 0.075 mm(2). The PA can deliver up to 20 dBm, which to date, is the highest reported output power at mm-wave frequencies in silicon without the need for power combining. At 60 GHz it achieves a peak power gain of 18 dB, a 1-dB compression (P1dB) of 13.1 dBm, and a peak power-added efficiency (PAE) of 12.7%. The amplifier is programmable through a three-wire serial digital interface enabeling an adaptive bias control from a 4-V supply.
引用
收藏
页码:1455 / 1463
页数:9
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