Measurement of chromatic dispersion of polarization modes in optical fibres using white-light spectral interferometry

被引:32
作者
Hlubina, P. [1 ]
Ciprian, D. [1 ]
Kadulova, M. [1 ]
机构
[1] Tech Univ Ostrava, Dept Phys, Ostrava 70833, Czech Republic
关键词
spectral interferometry; white-light source; Mach-Zehnder interferometer; group refractive index; chromatic dispersion; holey fibre; elliptical-core fibre; INTERFERENCE; WAVELENGTH; DEPENDENCE;
D O I
10.1088/0957-0233/21/4/045302
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We report on a white-light interferometric technique for a broad spectral range measurement (e.g. 500-1600 nm) of chromatic dispersion of polarization modes in short-length optical fibres. The technique utilizes an unbalanced Mach-Zehnder interferometer with a fibre under test of known length inserted in one of the interferometer arms and the other arm with adjustable path length. We record a series of spectral interferograms by VIS-NIR and NIR fibre-optic spectrometers to measure the equalization wavelength as a function of the path length difference, or equivalently the differential group index dispersion of one polarization mode. The differential group dispersion of the other polarization mode is obtained from measurement of the group modal birefringence dispersion. We verify the applicability of the method by measuring the chromatic dispersion of polarization modes in a birefringent holey fibre. We apply a five-term power series fit to the measured data and confirm by its differentiation that the chromatic dispersion agrees well with that specified by the manufacturer. We also measure by this technique the chromatic dispersion of polarization modes in an elliptical-core fibre.
引用
收藏
页数:7
相关论文
共 50 条
  • [41] Correlated speckle noise in white-light interferometry: theoretical analysis of measurement uncertainty
    Hering, Marco
    Koerner, Klaus
    Jaehne, Bernd
    APPLIED OPTICS, 2009, 48 (03) : 525 - 538
  • [42] An optical fiber high-precision absolute distance measurement technology incorporating white-light interferometry and single-wavelength interferometry
    Jia, Jinxu
    Xie, Fang
    Bao, Sitong
    OPTICAL FIBER TECHNOLOGY, 2025, 90
  • [43] White-light spectral interferometric technique used to measure the dispersion of the group birefringence of a uniaxial crystal
    Hlubina, P
    Optical Measurement Systems for Industrial Inspection IV, Pts 1 and 2, 2005, 5856 : 410 - 418
  • [44] Direct measurement of the zero-dispersion wavelength of tapered fibres using broadband-light interferometry
    Lu, P
    Ding, HM
    Mihailov, SJ
    MEASUREMENT SCIENCE AND TECHNOLOGY, 2005, 16 (08) : 1631 - 1636
  • [45] Measurement for polarization mode dispersion of LiNbO3 integrated waveguide modulator used white light interferometry
    Yu, Zhangjun
    Peng, Feng
    Yang, Jun
    Zhou, Ai
    Liang, Shuai
    Yuan, Yonggui
    Wu, Bing
    Zhang, Yu
    Liu, Zhihai
    Yuan, Libo
    24TH INTERNATIONAL CONFERENCE ON OPTICAL FIBRE SENSORS, 2015, 9634
  • [46] Nonlinear refractive index and chromatic dispersion simultaneous measurement in non zero dispersion shift optical fibres
    André, PS
    Teixeira, ALJ
    Lima, M
    da Rocha, JF
    Pinto, JL
    ICTON 2002: PROCEEDINGS OF THE 2002 4TH INTERNATIONAL CONFERENCE ON TRANSPARENT OPTICAL NETWORKS AND EUROPEAN SYMPOSIUM ON PHOTONIC CRYSTALS, VOL 1, 2002, : 111 - 114
  • [47] White-light frequency-domain interferometry using a Kosters prism
    Ohtsuka, Y
    Nagaoka, F
    Tanaka, S
    OPTICAL REVIEW, 1998, 5 (01) : 21 - 26
  • [48] Dispersion measurement of optical fibers by phase retrieval from spectral interferometry
    Qi, W.
    Huang, X.
    Ho, D.
    Yoo, S.
    Yong, K. T.
    Luan, F.
    JOURNAL OF OPTICS, 2017, 19 (05)
  • [49] Refractive index retrieval in the UV range using white light spectral interferometry
    Arosa, Yago
    Lopez-Lago, Elena
    de la Fuente, Raul
    OPTICAL MATERIALS, 2018, 82 : 88 - 92
  • [50] Group refractive index of fused silica and white-light spectral interferometry with a dispersive Michelson interferometer
    Hlubina, P
    OPTICAL MEASUREMENT SYSTEMS FOR INDUSTRIAL INSPECTION II: APPLICATION IN INDUSTRIAL DESIGN, 2001, 4398 : 229 - 237