Modeling the p-n junction i-u characteristic for an accurate calibration-free temperature measurement

被引：8

作者：

Kanoun, O ^{[1
]}

机构：

[1] Univ Fed Armed Forces Munich, Inst Mess & Automatisierungstechn, Neubiberg, Germany

来源：

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT | 2000年 / 49卷 / 04期

关键词：

bipolar transistors; calibration; calibration-free measurement; diodes; modeling; parameter extraction; P-N junctions; temperature measurement;

D O I：

10.1109/19.863946

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The p-n junction i-u characteristic model is decisive for the accuracy enhancement of calibration-free temperature measurement. In this paper, we give a survey of adapted physically-based p-n junction Cu characteristic models, such as the Ebers-Moll(2), the Ebers-Moll(3), and the Gummel-Poon model. Furthermore, we build new models through polynomial extensions to the fundamental Shockley model. The considered models were investigated with regard to the application of calibration-free temperature measurement; Experimental results show a model improvement with both physically and mathematically-based models.

引用

页码：901 / 904

页数：4