Comparative analysis of SVM and ANN classifiers for defective and non-defective fabric images classification

被引:11
作者
Anami, Basavaraj S. [1 ]
Elemmi, Mahantesh C. [1 ]
机构
[1] KLE Soc, Inst Technol, Comp Sci & Engn, Hubballi, Karnataka, India
关键词
Morphology; fabric images; defective fabric; non-defective fabric; SVM; ANN;
D O I
10.1080/00405000.2021.1915559
中图分类号
TB3 [工程材料学]; TS1 [纺织工业、染整工业];
学科分类号
0805 ; 080502 ; 0821 ;
摘要
The present work gives a comparative analysis of two different classifiers, namely, Support Vector Machine (SVM) and Artificial Neural Network (ANN) to classify defective and non-defective fabric images. The image dataset is prepared by considering all the varieties of fabric materials. The morphological operations, namely, erosion and dilation are used. A total of twelve morphological features are considered for fabric image analysis. Significant morphological features are selected by adopting Feed Backward Selection Technique (FBST) that is applied in the feature reduction process. The overall classification accuracies of 94% and 86.5% are obtained using SVM and ANN classifiers respectively. The SVM classifier is found to give better classification rate than ANN classifier. The work finds applications in apparel industry, quality analysis, cost estimation, online purchase of fabric etc.
引用
收藏
页码:1072 / 1082
页数:11
相关论文
共 17 条
  • [1] Agilandeswari V, 2014, 2014 INTERNATIONAL CONFERENCE ON INFORMATION COMMUNICATION AND EMBEDDED SYSTEMS (ICICES)
  • [2] [Anonymous], 2013, INT J COMPUTER TREND
  • [3] Banumathi P., 2012, INT J COMPUT ENG SCI, V2, P20
  • [4] Fabric Defect Detection Adopting Combined GLCM, Gabor Wavelet Features and Random Decision Forest
    Deotale, Nilesh Tejram
    Sarode, Tanuja K.
    [J]. 3D RESEARCH, 2019, 10 (01)
  • [5] A Feature Extraction Method Based on Morphological Operators for Automatic Classification of Leukocytes
    Gomez-Gil, Pilar
    Ramirez-Cortes, Manuel
    Gonzalez-Bernal, Jesus
    Pedrero, Angel Garcia
    Prieto-Castro, Cesar I.
    Valencia, Daniel
    Lobato, Ruben
    Alonso, Jose E.
    [J]. PROCEEDINGS OF THE SPECIAL SESSION OF THE SEVENTH MEXICAN INTERNATIONAL CONFERENCE ON ARTIFICIAL INTELLIGENCE - MICAI 2008, 2008, : 227 - 232
  • [6] Automatic Visual Defect Detection Using Texture Prior and Low-Rank Representation
    Huangpeng, Qizi
    Zhang, Hong
    Zeng, Xiangrong
    Huang, Wenwei
    [J]. IEEE ACCESS, 2018, 6 : 37965 - 37976
  • [7] Fabric Defect Detection using Wavelet Filter
    Karlekar, Vaibhav V.
    Biradar, M. S.
    Bhangale, K. B.
    [J]. 1ST INTERNATIONAL CONFERENCE ON COMPUTING COMMUNICATION CONTROL AND AUTOMATION ICCUBEA 2015, 2015, : 712 - 715
  • [8] Kolhe S., 2009, Adv. Comput. Res, V1, P18
  • [9] On the Use of Binary Features in a Rule-Based Approach for Defect on Patterned Textiles
    Lizarraga-Morales, Rocio A.
    Correa-Tome, Fernando E.
    Sanchez-Yanez, Raul E.
    Cepeda-Negrete, Jonathan
    [J]. IEEE ACCESS, 2019, 7 : 18042 - 18049
  • [10] Patil M., 2017, Int. Res. J. Eng. Technol, V4, P131