Transmission Line Fault Location in MMC-HVDC Grids Based on Dynamic State Estimation and Gradient Descent

被引:48
作者
Wang, Binglin [1 ,2 ,3 ,4 ]
Liu, Yu [1 ]
Lu, Dayou [1 ]
Yue, Kang [1 ]
Fan, Rui [5 ]
机构
[1] ShanghaiTech Univ, Sch Informat Sci & Technol, Shanghai 201210, Peoples R China
[2] Chinese Acad Sci, Shanghai Adv Res Inst, Shanghai 201210, Peoples R China
[3] Chinese Acad Sci, Shanghai Inst Microsyst & Informat Technol, Shanghai 200050, Peoples R China
[4] Univ Chinese Acad Sci, Beijing 100049, Peoples R China
[5] Univ Denver, Sch Engn & Comp Sci, Denver, CO 80208 USA
基金
中国国家自然科学基金;
关键词
Fault location; Power transmission lines; Transmission line measurements; Circuit faults; Power system dynamics; Time-domain analysis; Mathematical model; transmission lines; MMC-HVDC grids; dynamic state estimation; gradient descent; NATURAL FREQUENCY;
D O I
10.1109/TPWRD.2020.3013755
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper proposes a new fault location method for transmission lines in MMC-HVDC grids based on dynamic state estimation (DSE) and gradient descent. The method only requires a short data window of 5 ms after the occurrence of the fault and therefore is applicable for MMC-HVDC grids with high-speed tripping techniques. The method first builds a high-fidelity linear dynamic model of the DC transmission line, which accurately describes physical laws of the transmission line during the fault. Afterwards, the consistency between the measurements and the linear dynamic model is evaluated through the DSE algorithm. Finally, the actual fault location which corresponds to the best consistency is determined via the gradient descent algorithm. Compared to the existing DSE based fault location methods which solve highly nonlinear DSE problems, the proposed method only needs to solve a series of linear DSE problems, which overcomes the issues such as large numerical error and high computational burden especially for transmission lines in MMC-HVDC grids. Numerical experiments validates the effectiveness of the proposed method, with different fault types, resistances and locations. In addition, the method only requires a relatively low sampling rate of 20k samples per second.
引用
收藏
页码:1714 / 1725
页数:12
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