In-plane self-arrangement of high-density InAs quantum dots on GaAsSb/GaAs(001) by molecular beam epitaxy

被引:18
作者
Kanto, Toru [1 ]
Yamaguchi, Koichi [1 ]
机构
[1] Univ Electrocommun, Dept Elect Engn, Tokyo 1828585, Japan
关键词
D O I
10.1063/1.2717570
中图分类号
O59 [应用物理学];
学科分类号
摘要
InAs quantum dots (QDs) were grown on GaAsSb/GaAs(001) buffer layers by molecular beam epitaxy using a Stranski-Krastanov mode. A high QD density of about 1x10(11) cm(-2) was obtained for an Sb flux ratio of more than 0.14. In the case of high-density QD growth on the GaAsSb layers, many nanoholes were observed on the surface and located beside the QDs. In addition, one-dimensional QD chains were formed near nanogrooves and step edges. As the InAs growth proceeded, an in-plane arrangement of the InAs QDs was partially formed along < 010 > directions. It is considered that the in-plane arrangement of the QDs originates from the QD chains and the nanogrooves, aligned along < 010 > step edges. From transmission electron microscopy and photoluminescence measurements, it was found that the high-density InAs QDs on the GaAsSb buffer layer reveal high crystal quality. (c) 2007 American Institute of Physics.
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页数:4
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