Electrical properties of amorphous Ge26InxSe74-x chalcogenide thin films

被引:7
作者
Abd El-Ghany, W. A. [1 ]
Salem, A. M. [1 ]
Teleb, Nahed H. [1 ]
机构
[1] Natl Res Ctr, Phys Res Inst, Electron Microscopy & Thin Films Dept, El Bohoos Str, Giza 12622, Egypt
来源
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING | 2022年 / 128卷 / 06期
关键词
Ge(26)in(x)Se(74-x) thin film; Chalcogenide glasses; DC and AC conductivity; Activation energy; Correlated barrier hopping (CBH) model; DIELECTRIC-PROPERTIES; OPTICAL-PROPERTIES; AC CONDUCTIVITY; TEMPERATURE-DEPENDENCE; RELAXATION; FREQUENCY; GLASSES; BEHAVIOR;
D O I
10.1007/s00339-022-05615-9
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Amorphous Ge26InxSe74-x (1 <= x <= 5) chalcogenide thin films have been deposited by thermal evaporation technique. The temperature-dependence of DC conductivity and the temperature and frequency dependence of AC conductivity have been studied in the temperature range 295-523 K and in the frequency range 4-8 MHz. The study of the temperature-dependent of DC conductivity refers to the presence of two distinct conduction mechanisms; the activation energies for each were calculated and it was observed that their values decrease by increasing In content. Besides, in the low-temperature region, the variation of the conductivity against temperature was further analyzed according to the variable-range hopping model based on Mott's relation, whereby the hopping parameters were evaluated. For all investigated compositions, the variation of the AC conductivity against frequency at the studied temperatures was interpreted according to the correlated barrier hopping (CBH) model which based on Jonscher's power law, whereby the potential barrier height, W-M, and the theoretical optical bandgap, E-g, were calculated.
引用
收藏
页数:9
相关论文
共 48 条
[21]   ELECTRICAL-CONDUCTIVITY OF AMORPHOUS SEMICONDUCTING-FILMS OF SYSTEM (GE20AS30SE50-XTEX) [J].
FAYEK, SA ;
ELFOULY, MH ;
AMER, HH ;
AMAR, AH ;
ELOCKER, MM .
SOLID STATE COMMUNICATIONS, 1995, 93 (03) :213-217
[22]   FREQUENCY-DEPENDENT CONDUCTIVITY IN BISMUTH-VANADATE GLASSY SEMICONDUCTORS [J].
GHOSH, A .
PHYSICAL REVIEW B, 1990, 41 (03) :1479-1488
[23]   Effect of Se addition on optical and electrical properties of chalcogenide CdSSe thin films [J].
Hassanien, A. S. ;
Akl, Alaa A. .
SUPERLATTICES AND MICROSTRUCTURES, 2016, 89 :153-169
[24]   Electrical transport properties and Mott's parameters of chalcogenide cadmium sulphoselenide bulk glasses [J].
Hassanien, A. S. ;
Akl, Alaa A. .
JOURNAL OF NON-CRYSTALLINE SOLIDS, 2016, 432 :471-479
[25]   ac conductivity and dielectric properties of amorphous Se80Te20-xGex chalcogenide glass film compositions [J].
Hegab, N. A. ;
Afifi, M. A. ;
Atyia, H. E. ;
Farid, A. S. .
JOURNAL OF ALLOYS AND COMPOUNDS, 2009, 477 (1-2) :925-930
[26]   Temperature dependent dielectric and conductivity studies of polyvinyl alcohol-ZnO nanocomposite films by impedance spectroscopy [J].
Hemalatha, K. S. ;
Sriprakash, G. ;
Prasad, M. V. N. Ambika ;
Damle, R. ;
Rukmani, K. .
JOURNAL OF APPLIED PHYSICS, 2015, 118 (15)
[27]   Chalcogenide waveguides on a sapphire substrate for mid-IR applications [J].
Herzog, Amir ;
Hadad, Benjamin ;
Lyubin, Victor ;
Klebanov, Matvey ;
Reiner, Avraham ;
Shamir, Avishay ;
Ishaaya, Amiel A. .
OPTICS LETTERS, 2014, 39 (08) :2522-2525
[28]   A NEW UNDERSTANDING OF THE DIELECTRIC-RELAXATION OF SOLIDS [J].
JONSCHER, AK .
JOURNAL OF MATERIALS SCIENCE, 1981, 16 (08) :2037-2060
[29]   THE BEHAVIOR OF SIOX/SNO THIN DIELECTRIC FILMS IN AN ALTERNATING ELECTRIC-FIELD [J].
KHAN, GA ;
HOGARTH, CA .
JOURNAL OF MATERIALS SCIENCE, 1991, 26 (01) :17-22
[30]  
Khan ZH, 2002, CAN J PHYS, V80, P19, DOI 10.1139/P01-078