Dislocation effects in powder diffraction

被引:71
作者
Leoni, Matteo [1 ]
Martinez-Garcia, Jorge [1 ]
Scardi, Paolo [1 ]
机构
[1] Univ Trent, Dept Mat Engn & Ind Technol, I-38100 Trento, Italy
关键词
D O I
10.1107/S002188980702078X
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
Owing to the lack of proper models, mainly for the strain broadening component due to dislocations, full exploitation of whole powder pattern modelling for the microstructural analysis of materials has been limited so far to high-symmetry lattices. An extension of the dislocation-induced broadening model, valid for any lattice symmetry, is proposed here. Dislocation effects are modelled through the description of the dislocation contrast factor in terms of a crystallographic invariant whose terms can be either calculated when the material constants and slip systems are known (allowing a dislocation density to be refined) or refined on the experimental data for an effective estimation of dislocation effects.
引用
收藏
页码:719 / 724
页数:6
相关论文
共 36 条
[1]  
[Anonymous], 2004, Diffraction Analysis of the Microstructure of Materials
[2]  
[Anonymous], 1999, DEFECT MICROSTRUCTUR
[3]  
Armstrong N, 2006, Z KRISTALLOGR, P81
[4]  
Armstrong N, 2004, DIFFRACTION ANALYSIS OF THE MICROSTRUCTURE OF MATERIALS, P249
[5]  
BASS JD, 1995, ELASTICITY MINERALS
[6]   RUTILE-TYPE COMPOUNDS .4. SIO2, GEO2 AND A COMPARISON WITH OTHER RUTILE-TYPE STRUCTURES [J].
BAUR, WH ;
KHAN, AA .
ACTA CRYSTALLOGRAPHICA SECTION B-STRUCTURAL CRYSTALLOGRAPHY AND CRYSTAL CHEMISTRY, 1971, B 27 (NOV15) :2133-&
[7]  
CAHN RW, 1994, MAT SCI TECHNOLOGY C, V11
[8]   Synthesis and structural characterization of rutile SnO2 nanocrystals [J].
Chen, ZW ;
Lai, JKL ;
Shek, CH ;
Chen, HD .
JOURNAL OF MATERIALS RESEARCH, 2003, 18 (06) :1289-1292
[9]   Dislocation creep in MgSiO3 perovskite at conditions of the Earth's uppermost lower mantle [J].
Cordier, P ;
Ungár, T ;
Zsoldos, L ;
Tichy, G .
NATURE, 2004, 428 (6985) :837-840
[10]   Contrast factors of dislocations in the hexagonal crystal system [J].
Dragomir, IC ;
Ungár, T .
JOURNAL OF APPLIED CRYSTALLOGRAPHY, 2002, 35 :556-564