Comparison of Diffuse Roughness Scattering from Material Reflections at 500-750 GHz

被引：0

作者：

Serghiou, D. ^{[1
]}

Khalily, M. ^{[1
]}

Johny, S. ^{[2
]}

Stanley, M. ^{[2
]}

Fatadin, I ^{[2
]}

Brown, T. W. C. ^{[1
]}

Ridler, N. ^{[2
]}

Tafazolli, R. ^{[1
]}

机构：

[1] Univ Surrey, Inst Commun Syst ICS, Guildford GU2 7XH, Surrey, England

[2] Natl Phys Lab NPL, Teddington TW1 10LW, Middx, England

来源：

2021 15TH EUROPEAN CONFERENCE ON ANTENNAS AND PROPAGATION (EUCAP) | 2021年

关键词：

Diffuse Scattering; Multipath; Power Delay Profile; Reflection Loss; Terahertz (THz);

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

In this paper, an ultra-wideband Terahertz (THz) channel measurement campaign in the 500-750 GHz frequency band is presented. Power levels received from signal transmission by reflections off 14 different materials were measured in an indoor environment at Non-Line-of-Sight (NLoS) between the Transmitter (Tx) and Receiver (Rx), and compared to power levels received at Line-of-Sight (LoS) transmission. Frequency up-converters were used to transmit the signal using 26 dBi horn antennas at the Tx and Rx side and the signal was measured using a Vector Network Analyzer (VNA). From the data collected, the signal losses due to absorption and diffuse scattering from the rough surface of each Material Under Test (MUT) are calculated. The power delay profile (PDP) is presented, where multipath clustering due to diffuse scattering is observed for materials which have a high frequency selectivity, while less scattering and mostly specular reflection is shown for materials with low frequency selectivity.

引用

页数：5