Zeroth order Fabry-Perot resonance enabled ultra-thin perfect light absorber using percolation aluminum and silicon nanofilms

被引：37

作者：

Mirshafieyan, Seyed Sadreddin ^{[1
]}

Luk, Ting S. ^{[2
]}

Guo, Junpeng ^{[1
]}

机构：

[1] Univ Alabama, Dept Elect & Comp Engn, 301 Sparkman Dr, Huntsville, AL 35899 USA

[2] Sandia Natl Labs, Ctr Integrated Nanotechnol, POB 5800, Albuquerque, NM 87185 USA

来源：

OPTICAL MATERIALS EXPRESS | 2016年 / 6卷 / 04期

基金：

美国食品与农业研究所;

关键词：

LARGE-AREA; ABSORPTION; FILMS; ANTIREFLECTION; ENHANCEMENT; METALS;

D O I：

10.1364/OME.6.001032

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

We demonstrated perfect light absorption in optical nanocavities made of ultra-thin percolation aluminum and silicon films deposited on an aluminum surface. The total layer thickness of the aluminum and silicon films is one order of magnitude less than perfect absorption wavelength in the visible spectral range. The ratio of silicon cavity layer thickness to perfect absorption wavelength decreases as wavelength decreases due to the increased phase delays at silicon-aluminum boundaries at shorter wavelengths. It is explained that perfect light absorption is due to critical coupling of incident wave to the fundamental Fabry-Perot resonance mode of the structure where the round trip phase delay is zero. Simulations were performed and the results agree well with the measurement results. (C) 2016 Optical Society of America

引用

页码：1032 / 1042

页数：11

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