共 28 条
[7]
Comparison of the spatial variation in the barrier height of Si and GaAs schottky diodes as measured by ballistic electron emission microscopy
[J].
1600, (Elsevier Science Publ Co Inc)
[8]
Cross sectional ballistic electron emission microscopy for Schottky barrier height profiling on heterostructures
[J].
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS,
2006, 45 (3B)
:2204-2207
[9]
Cross sectional ballistic electron emission microscopy for schottky barrier height profiling on heterostructures
[J].
Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers,
2006, 45 (3 B)
:2204-2207