Atomic-layer deposition of wear-resistant coatings for microelectromechanical devices

被引:158
作者
Mayer, TM
Elam, JW
George, SM
Kotula, PG
Goeke, RS
机构
[1] Sandia Natl Labs, Albuquerque, NM 87185 USA
[2] Univ Colorado, Dept Chem & Biochem, Boulder, CO 80309 USA
关键词
D O I
10.1063/1.1570926
中图分类号
O59 [应用物理学];
学科分类号
摘要
Friction and wear are major concerns in the performance and reliability of microelectromechanical systems (MEMS) devices employing sliding contacts. While many tribological coating materials are available, most traditional surface coating processes are unable to apply conformal coatings to the high aspect ratio (height/width) structures typical of MEMS devices. We demonstrate that thin, conformal, wear-resistant coatings can be applied to Si surface-micromachined structures by atomic-layer deposition (ALD). For this demonstration, we apply 10-nm-thick films of Al2O3 using a binary reaction sequence with precursors of trimethyl aluminum and water. Deposition is carried out in a viscous flow reactor at 1 Torr and 168 degreesC, with N-2 as a carrier gas. Cross-section transmission electron microscopy analysis shows that films are uniform to within 5% on MEMS device structures with aspect ratio ranging from 0 to >100. Films are stoichiometric Al2O3, with no evidence of contamination from other species, and are amorphous. Preliminary friction and wear data show that ALD films have promising properties for application to MEMS devices. (C) 2003 American Institute of Physics.
引用
收藏
页码:2883 / 2885
页数:3
相关论文
共 19 条
[1]   The impact of solution agglomeration on the deposition of self-assembled monolayers [J].
Bunker, BC ;
Carpick, RW ;
Assink, RA ;
Thomas, ML ;
Hankins, MG ;
Voigt, JA ;
Sipola, D ;
de Boer, MP ;
Gulley, GL .
LANGMUIR, 2000, 16 (20) :7742-7751
[2]   SURFACE-CHEMISTRY OF AL2O3 DEPOSITION USING AL(CH3)(3) AND H2O IN A BINARY REACTION SEQUENCE [J].
DILLON, AC ;
OTT, AW ;
WAY, JD ;
GEORGE, SM .
SURFACE SCIENCE, 1995, 322 (1-3) :230-242
[3]   Growth of ZnO/Al2O3 alloy films using atomic layer deposition techniques [J].
Elam, JW ;
George, SM .
CHEMISTRY OF MATERIALS, 2003, 15 (04) :1020-1028
[4]   Viscous flow reactor with quartz crystal microbalance for thin film growth by atomic layer deposition [J].
Elam, JW ;
Groner, MD ;
George, SM .
REVIEW OF SCIENTIFIC INSTRUMENTS, 2002, 73 (08) :2981-2987
[5]   ZnO/Al2O3 nanolaminates fabricated by atomic layer deposition:: growth and surface roughness measurements [J].
Elam, JW ;
Sechrist, ZA ;
George, SM .
THIN SOLID FILMS, 2002, 414 (01) :43-55
[6]   Surface chemistry for atomic layer growth [J].
George, SM ;
Ott, AW ;
Klaus, JW .
JOURNAL OF PHYSICAL CHEMISTRY, 1996, 100 (31) :13121-13131
[7]   SURFACE MICROMACHINING FOR MICROSENSORS AND MICROACTUATORS [J].
HOWE, RT .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1988, 6 (06) :1809-1813
[8]   Automated analysis of SEM X-ray spectral images: A powerful new microanalysis tool [J].
Kotula, PG ;
Keenan, MR ;
Michael, JR .
MICROSCOPY AND MICROANALYSIS, 2003, 9 (01) :1-17
[9]   Atomic layer deposition (ALD):: from precursors to thin film structures [J].
Leskelä, M ;
Ritala, M .
THIN SOLID FILMS, 2002, 409 (01) :138-146
[10]   Critical review: Adhesion in surface micromechanical structures [J].
Maboudian, R ;
Howe, RT .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1997, 15 (01) :1-20