Soft lithography using acryloxy perfluoropolyether composite stamps

被引:117
作者
Truong, Tu T.
Lin, Rongsheng
Jeon, Seokwoo
Lee, Hee Hyun
Maria, Joana
Gaur, Anshu
Hua, Feng
Meinel, Ines
Rogers, John A. [1 ]
机构
[1] Univ Illinois, Beckman Inst, Dept Elect & Comp Engn, Dept Mat Sci & Engn,Dept Chem, Champaign, IL 61801 USA
[2] Univ Illinois, Frederick Seitz Mat Res Lab, Champaign, IL 61801 USA
[3] Clarkson Univ, Dept Elect & Comp Engn, Potsdam, NY 13699 USA
[4] Mitsubishi Chem Res & Innovat Ctr, Goleta, CA 93117 USA
关键词
D O I
10.1021/la062981k
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
This paper describes composite patterning elements that use a commercially available acryloxy perfluoropolyether (a-PFPE) in various soft lithographic techniques, including microcontact printing, nanotransfer printing, phase-shift optical lithography, proximity field nanopatterning, molecular scale soft nanoimprinting, and solvent assisted micromolding. The a-PFPE material, which is similar to a methacryloxy PFPE (PFPE-DMA) reported recently, offers a combination of high modulus (10.5 MPa), low surface energy (18.5 mNm(-1)), chemical inertness, and resistance to solvent induced swelling that make it useful for producing high fidelity patterns with these soft lithographic methods. The results are comparable to, and in some cases even better than, those obtained with the more widely explored material, high modulus poly(dimethylsiloxane) (h-PDMS).
引用
收藏
页码:2898 / 2905
页数:8
相关论文
共 30 条
[1]   Photopatternable silicon elastomers with enhanced mechanical properties for high-fidelity nanoresolution soft lithography [J].
Choi, KM .
JOURNAL OF PHYSICAL CHEMISTRY B, 2005, 109 (46) :21525-21531
[2]   A photocurable poly(dimethylsiloxane) chemistry designed for soft lithographic molding and printing in the nanometer regime [J].
Choi, KM ;
Rogers, JA .
JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 2003, 125 (14) :4060-4061
[3]   New approaches to nanofabrication: Molding, printing, and other techniques [J].
Gates, BD ;
Xu, QB ;
Stewart, M ;
Ryan, D ;
Willson, CG ;
Whitesides, GM .
CHEMICAL REVIEWS, 2005, 105 (04) :1171-1196
[4]   Collapse of stamps for soft lithography due to interfacial adhesion [J].
Hsia, KJ ;
Huang, Y ;
Menard, E ;
Park, JU ;
Zhou, W ;
Rogers, J ;
Fulton, JM .
APPLIED PHYSICS LETTERS, 2005, 86 (15) :1-3
[5]   Polymer imprint lithography with molecular-scale resolution [J].
Hua, F ;
Sun, YG ;
Gaur, A ;
Meitl, MA ;
Bilhaut, L ;
Rotkina, L ;
Wang, JF ;
Geil, P ;
Shim, M ;
Rogers, JA ;
Shim, A .
NANO LETTERS, 2004, 4 (12) :2467-2471
[6]   Processing dependent behavior of soft imprint lithography on the 1--10-nm scale [J].
Hua, Feng ;
Gaur, Anshu ;
Sun, Yugang ;
Word, Michael ;
Jin, Niu ;
Adesida, Ilesanmi ;
Shim, Moonsub ;
Shim, Anne ;
Rogers, John A. .
IEEE TRANSACTIONS ON NANOTECHNOLOGY, 2006, 5 (03) :301-308
[7]   Stamp collapse in soft lithography [J].
Huang, YGY ;
Zhou, WX ;
Hsia, KJ ;
Menard, E ;
Park, JU ;
Rogers, JA ;
Alleyne, AG .
LANGMUIR, 2005, 21 (17) :8058-8068
[8]   Constraints on microcontact printing imposed by stamp deformation [J].
Hui, CY ;
Jagota, A ;
Lin, YY ;
Kramer, EJ .
LANGMUIR, 2002, 18 (04) :1394-1407
[9]   Fabricating three dimensional nanostructures using two photon lithography in a single exposure step [J].
Jeon, S ;
Malyarchuk, V ;
Rogers, JA ;
Wiederrecht, GP .
OPTICS EXPRESS, 2006, 14 (06) :2300-2308
[10]   Fabricating complex three-dimensional nanostructures with high-resolution conformable phase masks [J].
Jeon, S ;
Park, JU ;
Cirelli, R ;
Yang, S ;
Heitzman, CE ;
Braun, PV ;
Kenis, PJA ;
Rogers, JA .
PROCEEDINGS OF THE NATIONAL ACADEMY OF SCIENCES OF THE UNITED STATES OF AMERICA, 2004, 101 (34) :12428-12433