Low temperature growth of gallium nitride on quartz and sapphire substrates

被引:0
作者
Goldys, EM [1 ]
Paterson, MJ [1 ]
Zuo, HY [1 ]
Tansley, TL [1 ]
机构
[1] Macquarie Univ, Semicond Sci & Technol Labs, N Ryde, NSW 2109, Australia
来源
SILICON CARBIDE, III-NITRIDES AND RELATED MATERIALS, PTS 1 AND 2 | 1998年 / 264-2卷
关键词
low temperature laser and plasma assisted metalorganic chemical vapour deposition; quartz; sapphire; X-ray diffraction; Raman effect; optical absorption;
D O I
10.4028/www.scientific.net/MSF.264-268.1205
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Gallium nitride films have been grown using combined ultraviolet excimer laser and microwave plasma enhanced metalorganic chemical vapour deposition. A range of growth conditions was used, including low substrate temperatures between 380 degrees C and 625 degrees C, which enabled the use of quartz substrates, in addition to more common r-plane sapphire. Films grown on quartz and on sapphire were characterised using X-ray diffraction, Raman spectroscopy and optical transmission. Evidence is given that layers grown on quartz have similar structural and optical quality as those grown on sapphire, and both contain large-scale, oriented crystallites embedded in the microcrystalline, randomly oriented medium with intermediate range order and cubic symmetry. The disorder correlates well with the substrate temperature during growth.
引用
收藏
页码:1205 / 1208
页数:4
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