Post-deposition control of ferroelastic stripe domains and internal electric field by thermal treatment

被引:13
作者
Feigl, L. [1 ]
Janolin, P. -E. [2 ]
Yamada, T. [3 ,4 ]
Iwanowska, M. [1 ]
Sandu, C. S. [1 ]
Setter, N. [1 ]
机构
[1] EPFL Swiss Fed Inst Technol, Ceram Lab, CH-1015 Lausanne, Switzerland
[2] Ecole Cent Paris, Lab Struct Proprietes & Modelisat Solides, UMR CNRS, F-92295 Chatenay Malabry, France
[3] Nagoya Univ, Dept Mat Phys & Energy Engn, Nagoya, Aichi 4648603, Japan
[4] Japan Sci & Technol Agcy, PRESTO, Kawaguchi, Saitama 3320012, Japan
基金
瑞士国家科学基金会; 欧洲研究理事会;
关键词
THIN-FILMS; POLARIZATION; DEPOSITION; WALLS;
D O I
10.1063/1.4906295
中图分类号
O59 [应用物理学];
学科分类号
摘要
The dependence of the formation of ferroelastic stripe domain patterns on the thermal history is investigated by detailed piezoresponse force microscopy and X-ray diffraction experiments after and during annealing of tensile strained tetragonal Pb(Ti,Zr)O-3 epitaxial thin films on DyScO3 substrates. In particular, the ferroelastic pattern is reversibly interchanged between a cross-hatched and a stripe domain pattern if the films are cooled at different rates after annealing above the formation temperature of a-domains. Different types of 180 degrees and non-180 degrees patterns can be created, depending on the thermal treatment. The changes in the 180 degrees domain structure and lattice parameters are attributed to a change of oxygen vacancy concentration, which results in a modification of the internal electric field and unit cell size, causing also a shift of T-C. Thermal treatment is done on rhombohedral La:BiFeO3 thin films as well. It is observed that also in these films, appropriate heat treatment modifies the domain pattern and films with a stripe domain pattern can be created, confirming the general validity of the developed model. (C) 2015 AIP Publishing LLC.
引用
收藏
页数:5
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