Thickness dependent structural, magnetic and transport properties of nanostructured cobalt thin films

被引：8
|
作者：
Sharma, A. [1 ]
Tripathi, S. [1 ]
Brajpuriya, R. [1 ]
Shripathi, T. [1 ]
Chaudhari, S. M. [1 ]
机构：
[1] Univ Grant Commiss, Dept Atom Energy Consortium Sci Res, Indore 452017, India
来源：
JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY | 2007年 / 7卷 / 06期
关键词：
Co thin film; XRD; MOKE; AFM; resistivity;
D O I：
10.1166/jnn.2007.765
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
This paper presents structural, magnetic, and transport properties measurements carried out on Co thin film as a function of thickness. The structure of the Co thin film changes from amorphous to nano-crystalline with the increase in film thickness. The corresponding magnetic and transport measurements show drastic changes in coercivity, saturation field and resistivity value as a function of Co film thickness. Observed magnetization and resistivity behaviour is mainly attributed to the (i) Change in crystal structure, (ii) stress relaxation, (iii) grain growth as revealed by X-ray diffraction (XRD), and atomic force microscopy (AFM) measurements.
引用
收藏
页码：2041 / 2045
页数：5
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