Development of a grating-based interferometer for six-degree-of-freedom displacement and angle measurements

被引:128
作者
Hsieh, Hung-Lin [1 ]
Pan, Ssu-Wen [1 ]
机构
[1] Natl Taiwan Univ Sci & Technol, Dept Mech Engn, Taipei 10607, Taiwan
关键词
ABSOLUTE DISTANCE MEASUREMENT; HETERODYNE INTERFEROMETRY; SURFACE ENCODER; ACCURACY; SYSTEM; STAGE; RESOLUTION;
D O I
10.1364/OE.23.002451
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
A grating-based interferometer for 6-DOF displacement and angle measurement is proposed in this study. The proposed interferometer is composed of three identical detection parts sharing the same light source. Each detection part utilizes three techniques: heterodyne, grating shearing, and Michelson interferometries. Displacement information in the three perpendicular directions (X, Y, Z) can be sensed simultaneously by each detection part. Furthermore, angle information (0(X), 0(Y), 0(Z)) can be obtained by comparing the displacement measurement results between two corresponding detection parts. The feasibility and performance of the proposed grating-based interferometer are evaluated in displacement and angle measurement experiments. In comparison with the internal capacitance sensor built into the commercial piezo-stage, the measurement resolutions of the displacement and angle of our proposed interferometer are about 2 nm and 0.05 mu rad. (C) 2015 Optical Society of America
引用
收藏
页码:2451 / 2465
页数:15
相关论文
共 21 条
[1]   An alternative method for measuring small displacements with differential phase difference of dual-prism and heterodyne interferometry [J].
Chen, Kun-Huang ;
Chiu, Huang-Sen ;
Chen, Jing-Heng ;
Chen, You-Cheng .
MEASUREMENT, 2012, 45 (06) :1510-1514
[2]   Measurement of small displacements with polarization properties of internal reflection and heterodyne interferometry [J].
Chen, Kun-Huang ;
Chen, Jing-Heng ;
Cheng, Ching-Hwa ;
Yang, Tsung-Han .
OPTICAL ENGINEERING, 2009, 48 (04)
[3]   Absolute distance measurement by using modified dual-wavelength heterodyne Michelson interferometer [J].
Chen, Kun-Huang ;
Chen, Jing-Heng ;
Lu, Shen-Hua ;
Chang, Wei-Yao ;
Wu, Chi-Chang .
OPTICS COMMUNICATIONS, 2009, 282 (09) :1837-1840
[4]   Straightness/coaxiality measurement system with transverse Zeeman dual-frequency laser [J].
Chen, QH ;
Lin, DJ ;
Wu, J ;
Yan, JQ ;
Yin, CY .
MEASUREMENT SCIENCE AND TECHNOLOGY, 2005, 16 (10) :2030-2037
[5]   Small absolute distance measurement with nanometer resolution using geometrical optics principles and a SPP, angular sensor [J].
Chiu, Ming-Hung ;
Shih, Bo-Yuan ;
Lai, Chih-Wen ;
Shyu, Lih-Horng ;
Wu, Tsung-Hsien .
SENSORS AND ACTUATORS A-PHYSICAL, 2008, 141 (01) :217-223
[6]   High-resolution, high-speed, low data age uncertainty, heterodyne displacement measuring interferometer electronics [J].
Demarest, FC .
MEASUREMENT SCIENCE AND TECHNOLOGY, 1998, 9 (07) :1024-1030
[7]  
ESTLER WT, 1985, APPL OPTICS, V24, P808, DOI 10.1364/AO.24.000808
[8]   Development of a simple system for simultaneously measuring 6DOF geometric motion errors of a linear guide [J].
Feng Qibo ;
Zhang Bin ;
Cui Cunxing ;
Kuang Cuifang ;
Zhai Yusheng ;
You Fenglin .
OPTICS EXPRESS, 2013, 21 (22) :25805-25819
[9]   A three-axis autocollimator for detection of angular error motions of a precision stage [J].
Gao, W. ;
Saito, Y. ;
Muto, H. ;
Arai, Y. ;
Shimizu, Y. .
CIRP ANNALS-MANUFACTURING TECHNOLOGY, 2011, 60 (01) :515-518
[10]   Two-dimensional displacement measurement by quasi-common-optical-path heterodyne grating interferometer [J].
Hsieh, Hung-Lin ;
Chen, Jyh-Chen ;
Lerondel, Gilles ;
Lee, Ju-Yi .
OPTICS EXPRESS, 2011, 19 (10) :9770-9782