The effect of grounding on electrostatic damage

被引:0
|
作者
Rider, Gavin [1 ]
机构
[1] Microtome, Colorado Springs, CO 80907 USA
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暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Electrostatic damage during semiconductor manufacturing is nothing new, but despite considerable advancement in the management of electrostatic problems, ESD damage is still being sustained. Reticles (photomasks) are among the most delicate objects in the semiconductor manufacturing environment and since they are critical to the production of virtually everything electronic, a great deal of attention has been paid to preventing them from being damaged. In studying how reticles become damaged, new insight has been gained that is relevant to the damage mechanisms in other electrostatic-sensitive objects.
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页码:38 / 38
页数:1
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